SIP Substrate Passive Component Integration Signal Integrity

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Solution Overview

Problem

Current integrated circuit packaging systems face challenges in achieving high signal quality without increasing package size, particularly in high-speed devices that require tight impedance control, and struggle with incorporating discrete passive components efficiently in system-on-chip (SOC) and system-in-package (SIP) designs.

Innovation Solution

The system involves fabricating a system-in-package substrate, mounting two integrated circuit dice closely together with a minimum space, and coupling passive components over and between them, using on-die contacts like solder paste or conductive epoxy for direct mounting and electrical interconnects to improve signal quality and reduce interconnect paths.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If discrete passive components are mounted on substrate adjacent to ICs with bonding wires, then electrical connections are established, but signal quality deteriorates due to long interconnect paths and impedance control issues

Engineering Contradiction:
Improvesignal qualityVSAvoidinterconnect path length
Core Design Contradiction:
ReliabilityVSLength of stationary object

Solution Approach 1:

The patent merges the passive components directly with the IC die by forming conductive pathways through the substrate that connect component terminals directly to IC contact pads, eliminating separate bonding wire interconnects and reducing overall path length

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The substrate acts as an intermediary by providing embedded conductive pathways that directly connect passive components to ICs, replacing the traditional bonding wire intermediary and enabling tighter impedance control

Inventive Principle:
Principle #24Intermediary (Mediator)

2Reliability

If ICs are pushed closer together to reduce interconnect path effects, then signal quality improves, but manufacturing complexity increases due to reconfiguration requirements

Engineering Contradiction:
Improvesignal qualityVSAvoidpackage configuration complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent segments the functional elements (ICs and passive components) and distributes them throughout the substrate, allowing flexible arrangement that minimizes interconnect paths while maintaining standard manufacturing processes

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent utilizes three-dimensional placement of components and multi-layer substrate routing to reduce interconnect path length without requiring ICs to be pushed closer together in the planar dimension, thereby avoiding manufacturing reconfiguration

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

3Reliability

If more interconnect structures are added to accommodate high-speed interconnections, then signal quality improves, but package size increases

Engineering Contradiction:
Improvesignal qualityVSAvoidpackage size
Core Design Contradiction:
ReliabilityVSArea of stationary object

Solution Approach 1:

The patent embeds passive components within the package structure and integrates their interconnect pathways within the substrate layers, nesting multiple functions within a compact volume without increasing overall package footprint

Inventive Principle:
Principle #7Nested doll (Nesting)

Data Source

PatentUS7679177B2Integrated circuit packaging system with passive components
Publication Date: 2010.03.16 STATS CHIPPAC MANAGEMENT PTE LTD
  • US7679177B2 patent drawing
  • US7679177B2 patent drawing
  • US7679177B2 patent drawing

AI summary

An integrated circuit packaging system comprising: fabricating a system-in-package substrate; mounting a first integrated circuit die on the system-in-package substrate; mounting a second integrated circuit die on the system-in-package substrate; and coupling a passive component over and between the first integrated circuit die and the second integrated circuit die.