SiPM Gain Measurement via Dark Event Energy Spectrogram

The patent implements a feedback mechanism by continuously monitoring the gain of SiPM sensors through dark event analysis and applying real-time correction to compensate for temperature-induced gain variations. The system measures gain changes and uses this information to adjust measurements, ensuring stable performance despite temperature fluctuations.

The system performs self-diagnosis and self-correction by automatically detecting gain changes through dark event analysis and compensating for them without external intervention. The SiPM gain measurement and compensation process is autonomous, allowing the system to maintain accuracy independently.

The system uses the SiPM's own dark events (intrinsic noise) as the measurement signal, eliminating the need for external calibration sources or additional measurement hardware. This self-service approach simplifies the overall system while enabling accurate gain monitoring.

Instead of treating dark events as unwanted noise to be discarded, the patent recovers useful information from them by analyzing the energy distribution of dark events to determine gain changes. This transforms a harmful factor into a beneficial measurement resource.

The system recovers measurement information from dark events that occur continuously during normal operation, allowing gain monitoring without dedicating separate measurement time. The dark events provide ongoing feedback about gain changes as they happen.

The gain measurement process operates continuously by analyzing dark events that occur naturally during sensor operation, rather than performing discrete periodic measurements. This continuous monitoring maintains accuracy without significant time loss.