Non-Invasive Skin Layer Thickness Analyzer Using Thermal Step Response

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Solution Overview

Problem

Existing methods for determining the thickness of layers, such as human skin, are inaccurate and invasive, making it difficult to estimate the thickness of the hypodermis in medical and fitness applications.

Innovation Solution

A thickness analyzer unit comprising a temperature change device, temperature sensor, memory, and controller that induces a temperature change and calculates the thickness based on thermal conductivity, specific thermal capacity, and density values, using a thermal step response to determine the time constant and subsequently the layer thickness.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If known methods are used to determine layer thickness, then the measurement can be performed, but the accuracy of thickness estimation is insufficient

Engineering Contradiction:
Improvethickness estimation accuracyVSAvoidmeasurement reliability
Core Design Contradiction:
Measurement precisionVSReliability

Solution Approach 1:

The invention changes the measurement parameter from direct physical measurement to thermal response measurement. By measuring temperature changes over time in response to a thermal stimulus, the system indirectly determines layer thickness through thermal conductivity, specific heat capacity, and density parameters, achieving higher accuracy without invasive procedures

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The invention replaces mechanical or physical measurement methods with a thermal field-based measurement system. A temperature change device applies thermal energy and sensors detect thermal response, substituting traditional mechanical measurement approaches that are either inaccurate or invasive

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

2Measurement precision

If invasive methods are used to measure layer thickness, then measurement can be performed, but the procedure becomes invasive and complex

Engineering Contradiction:
Improvethickness measurement capabilityVSAvoidinvasiveness of procedure
Core Design Contradiction:
Measurement precisionVSEase of operation

Solution Approach 1:

The invention introduces thermal energy as an intermediary medium to measure layer thickness. Instead of directly measuring physical dimensions or requiring contact with the layer, the system uses temperature changes in response to applied heat as an intermediate indicator, enabling non-invasive measurement while maintaining precision

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The invention replaces invasive mechanical measurement methods with a non-invasive thermal measurement system. The temperature change device and sensor system eliminates the need for physical contact or disruption of the layer being measured, making the procedure easy to perform while maintaining measurement capability

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables quick, accurate, and non-invasive estimation of the combined thickness of skin layers, providing reliable thickness data independent of gender, weight, or body mass index, and applicable to various systems with substantially continuous layers.

Implementation Method 1

Heat transfer includes thermal conduction, thermal convection, and thermal radiation

Methodology Applied
Scientific EffectThermal conduction: Conduction (thermal)

Implementation Method 2

Heat transfer includes thermal conduction, thermal convection, and thermal radiation

Methodology Applied
Scientific EffectThermal radiation: Thermal Radiation

Data Source

PatentUS11592380B2System and method for detecting a thickness of a layer
Publication Date: 2023.02.28 ROBERT BOSCH GMBH
  • US11592380B2 patent drawing
  • US11592380B2 patent drawing
  • US11592380B2 patent drawing

AI summary

A thickness analyzer unit for determining a thickness of a layer includes a temperature change device, a temperature sensor, a memory, and a controller. The temperature change device is configured to induce a temperature change of the layer from a first temperature value to a second temperature value. The temperature sensor is configured to generate first temperature data corresponding to the first temperature value and second temperature data corresponding to the second temperature value. The memory is configured to store the first and second temperature values, a thermal conductivity value, a specific thermal capacity value, and a density value. The controller is configured (i) to determine a time constant value of the layer based on the first and second temperature values, and (ii) to determine the thickness of the layer based on the time constant value, the thermal conductivity value, the specific thermal capacity value, and the density value.