Slider Operator Mechanism for Testing Socket Coupling
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Solution Overview
Problem
Existing testing socket systems for semiconductors are inconvenient to couple and decouple from testing-circuit substrates due to the need for manual loosening of fastening screws, making maintenance and socket replacement cumbersome, especially for small-sized sockets.
Innovation Solution
A testing device with a slider operator that includes a main body and a slider pressing portion, allowing the testing socket to be easily coupled and decoupled from the substrate using inclined surfaces and elastic members for smooth sliding and locking mechanisms, facilitated by a socket supporting frame and alignment features.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a fastening screw is used to couple the testing socket to the substrate, then the connection is stable and reliable, but the operation becomes inconvenient and time-consuming due to manual loosening and tightening
Solution Approach 1:
The patent replaces the static fastening screw system with a dynamic slider mechanism that can be easily moved along the substrate to couple and decouple the testing socket. The slider has a pressing portion that can be manually actuated to engage or disengage the socket, providing both stability when coupled and ease of operation for coupling/decoupling.
Solution Approach 2:
The patent extracts the fastening function from the screw and separates it into a dedicated slider component. This allows the coupling mechanism to be independently optimized for ease of operation while maintaining connection stability through the slider's pressing action on the socket.
2Volume of moving object
If the testing socket is made small in size, then the testing device is more compact and efficient, but manual handling becomes very inconvenient and difficult
Solution Approach 1:
The patent introduces the slider as an intermediary component between the operator's hand and the small testing socket. The slider has a larger pressing portion that is easy to grasp and manipulate, which translates small socket positioning into easy manual operation, thus bridging the size discrepancy between the compact socket and human hand dexterity.
Solution Approach 2:
The patent adds a new dimension of operation by introducing the slider that moves along the substrate surface. Instead of directly handling the small socket in three-dimensional space, the operator interacts with the slider's pressing portion that moves in a constrained linear path, making manipulation easier despite the socket's small size.
3Area of stationary object
If the testing socket is mounted in a small groove on the substrate, then the device is more compact, but coupling and decoupling operations become very inconvenient
Solution Approach 1:
The patent segments the coupling function from the mounting groove by introducing a movable slider component. The slider can be positioned at different locations along the groove, allowing the operator to easily access and manipulate the socket without needing to reach into the confined groove space directly.
Solution Approach 2:
The patent makes the coupling system dynamic by introducing the movable slider that can be actuated along the groove. This dynamic component allows the operator to easily engage and disengage the socket by moving the slider, rather than performing manual operations within the constrained groove space.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables convenient and efficient operation of coupling and decoupling small-size testing sockets from the testing-circuit substrate, simplifying maintenance and reducing handling difficulties.
Implementation Method 1
a slider pressing portion up/down-movably supported on the main body and moving down from the main body toward the slider
Data Source
AI summary
Disclosed is a testing device. The testing device includes a testing socket configured to support a plurality of probes, a testing-circuit substrate which includes a contact point to contact the probe, a slider which makes the testing socket be coupled to and separated from the testing-circuit substrate, and a slider operator which includes a main body arranged on the testing socket, and a slider pressing portion up/down-movably supported on the main body and moving down from the main body toward the slider so that the slider can slide along a surface direction of the testing socket.