Small Pitch BGA Package Assembly for Burn-In Testing
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
The high cost and manufacturing challenges of burn-in apparatuses that accommodate higher density ball grid array (BGA) devices with pitches less than 1.0 mm, due to size limitations and structural constraints, make it difficult to reliably test and sort defective components.
Innovation Solution
A package assembly with a pin-out configuration that includes a set of first contacts for direct contact with the burn-in apparatus and a set of second contacts that do not contact the apparatus, allowing for a smaller pitch without modifying the burn-in apparatus structure, enabling compatibility with standard burn-in equipment and facilitating self-testing during the burn-in process.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Quantity of substance
If the pitch of BGA devices is decreased to increase contact density, then the functional density of the package assembly is improved, but the compatibility with conventional burn-in apparatuses deteriorates
Solution Approach 1:
The contact array is segmented into two distinct sets: first contacts arranged at a larger pitch for burn-in testing, and second contacts arranged at a smaller pitch for normal operation. This segmentation allows the package assembly to interface with conventional burn-in apparatuses through the first contacts while maintaining high-density second contacts for functional use.
Solution Approach 2:
Different regions of the contact array have different pitch characteristics. The first contacts are positioned and spaced to match conventional burn-in apparatus pitch requirements, while the second contacts are positioned and spaced at higher density for normal operation. This local variation in pitch quality enables dual functionality.
2Quantity of substance
If the pitch of BGA devices is decreased to increase contact density, then the functional density of the package assembly is improved, but the manufacturing cost of burn-in apparatuses increases
Solution Approach 1:
The contact array is segmented into two distinct sets: first contacts arranged at a larger pitch for burn-in testing, and second contacts arranged at a smaller pitch for normal operation. This segmentation allows the package assembly to interface with conventional burn-in apparatuses through the first contacts while maintaining high-density second contacts for functional use.
Solution Approach 2:
The first contacts serve dual purposes: they enable high-density packaging overall while simultaneously providing compatibility with conventional burn-in apparatuses. This multi-functionality allows existing burn-in equipment to test high-density packages without modification, avoiding increased manufacturing costs.
3Quantity of substance
If the pitch of BGA devices is decreased to increase contact density, then the functional density of the package assembly is improved, but the reliability of burn-in testing deteriorates
Solution Approach 1:
The contact array is segmented into two distinct sets: first contacts arranged at a larger pitch for burn-in testing, and second contacts arranged at a smaller pitch for normal operation. This segmentation allows the package assembly to interface with conventional burn-in apparatuses through the first contacts while maintaining high-density second contacts for functional use.
Solution Approach 2:
The first contacts are positioned and configured to replicate the pitch and arrangement requirements of conventional burn-in apparatuses. This copying approach ensures that high-density packages can be reliably tested on existing equipment, maintaining testing reliability while achieving higher overall contact density.
Data Source
AI summary
A package assembly (18) that is selectively coupled to a burn-in apparatus (228P) during a burn-in process includes a pin-out (20) having an array of contacts (22) including a set of first contacts (222F) and a set of second contacts (222S). The first contacts (222F) are required for the burn-in process, and are each adapted to be in contact with a corresponding contact member (232P) of the burn-in apparatus (228P) during the burn-in process. The second contacts (222S) are not required for the burn-in process. The second contacts (222S) do not contact any of the contact members (232P) during the burn-in process. The contact members (232P) are arranged at a first pitch. In various embodiments, the array of contacts (22) is arranged at a second pitch that is smaller than the first pitch.


