Smart Probe With Embedded IC Chip For CMM Calibration

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Current coordinate measurement machines (CMMs) face challenges with time-consuming calibration processes, especially when switching between differently sized probes, leading to downtime and limited interchangeability, with existing systems requiring manual setup and limited scalability.

Innovation Solution

The implementation of an 'intelligent' probe system with an embedded IC chip that electronically serializes probes, allowing for automatic recognition, calibration data storage, and dynamic configuration, enabling fast, error-free probe swapping and use on multiple CMM arms without the need for recalibration.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If differently sized probes are interchanged on a CMM, then measurement versatility is improved, but calibration time increases significantly

Engineering Contradiction:
Improveprobe interchangeabilityVSAvoidcalibration time
Core Design Contradiction:
Adaptability or versatilityVSLoss of time

Solution Approach 1:

The probe's identification data and calibration parameters are pre-stored in an IC chip embedded in the probe itself. When the probe is attached to the CMM arm, the system automatically reads this pre-stored information, eliminating the need for time-consuming manual calibration procedures each time a probe is changed.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The probe contains its own identification and calibration data in an embedded IC chip, making it self-identifying. The CMM system automatically retrieves this information without requiring external manual input or setup, allowing the probe to essentially calibrate itself upon attachment.

Inventive Principle:
Principle #25Self-service

2Reliability

If manual setup and entry is required for each probe in memory, then system reliability is improved through accurate data recording, but device complexity and setup time increase

Engineering Contradiction:
Improvedata accuracyVSAvoidmanual setup requirements
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The manual mechanical process of entering probe data into system memory is replaced by an electronic automatic reading process. The CMM system automatically reads identification and calibration data from the IC chip embedded in the probe, eliminating manual data entry while maintaining data accuracy.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

Instead of manually creating probe data records, the system automatically copies identification and calibration information from the IC chip in the probe directly into the system memory, ensuring accuracy while reducing complexity.

Inventive Principle:
Principle #26Copying

3Adaptability or versatility

If probe characteristics are stored in external memory requiring manual entry, then scalability is limited, but ease of operation is maintained through simple procedures

Engineering Contradiction:
Improvesystem scalabilityVSAvoidsetup simplicity
Core Design Contradiction:
Adaptability or versatilityVSEase of operation

Solution Approach 1:

The probe system is segmented into a modular structure with an embedded IC chip containing identification and calibration data. This allows individual probes to be independently configured and identified, enabling unlimited scalability without increasing operational complexity.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The IC chip embedded in each probe provides universal functionality for storing identification and calibration data. This standardized approach allows any probe with an IC chip to be automatically recognized and used, greatly expanding system scalability while maintaining ease of operation through automatic data retrieval.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Data Source

PatentUS8661700B2Smart probe
Publication Date: 2014.03.04 FARO TECHNOLOGIES INC
  • US8661700B2 patent drawing
  • US8661700B2 patent drawing
  • US8661700B2 patent drawing

AI summary

The present system, method, article of manufacture, software, and apparatus is an “intelligent” probe system and components thereof and may openly encompass, in at least an embodiment, an embedded IC chip located in an interchangeable probe(s) which offers repeatable, fast, easy, and error free probe swapping on a CMM.