Smart SSD Dynamic Performance Reporting
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Solution Overview
Problem
Conventional storage devices lack the ability to dynamically report their actual performance capabilities as they age and wear out, leading to inaccurate performance assessments in cloud computing environments where workload distribution and resource allocation are based on static specifications.
Innovation Solution
Implementing a smart SSD technology with compute-in-storage capabilities that executes performance tests and stores dynamic performance-related information, allowing for demand-querying and periodic re-evaluation of storage performance, enabling accurate reporting of current capabilities to host systems.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If static performance specifications are used for storage devices, then device complexity is reduced and ease of operation is improved, but measurement precision of actual storage performance deteriorates
Solution Approach 1:
The patent implements dynamic performance testing where the storage device automatically executes performance tests at different stages of its lifecycle (new device, periodic intervals,, and upon wear detection). This transforms static performance specifications into dynamic, adaptive performance assessment, allowing the system to adjust testing frequency and parameters based on device age and usage patterns.
Solution Approach 2:
The storage device performs self-diagnosis and self-testing by automatically executing performance tests without external intervention. The device monitors its own wear levels, triggers appropriate performance tests, and reports its actual performance capabilities to the host system, eliminating the need for complex external testing infrastructure.
2Measurement precision
If performance tests are executed frequently to maintain accurate performance reporting, then measurement precision is improved, but productivity is reduced due to increased testing overhead
Solution Approach 1:
The system implements periodic performance testing where tests are executed at predetermined time intervals rather than continuously. The testing frequency is adjusted based on device age, usage patterns, and wear levels, performing tests more frequently when the device is new or showing signs of degradation, and less frequently when stable.
Solution Approach 2:
The performance testing parameters are dynamically adjusted based on device conditions. The system changes test frequency, test intensity, and test types according to device age, wear level, and operational context, optimizing the balance between measurement accuracy and productivity impact.
Data Source
AI summary
An embodiment of a semiconductor apparatus may include technology to receive a request for storage-related resources, and demand-query one or more persistent storage media devices for device-determined performance-related information in response to the request, where the device-determined performance-related information is based on dynamically measured performance of persistent storage media of the device itself. Other embodiments are disclosed and claimed.