Smart Testing Management for RF Interference

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Solution Overview

Problem

Current DUT testing systems face interference issues between multiple devices under test, leading to measurement errors and increased production costs due to the need for high electrical isolation or sequential testing, which limits the number of devices that can be tested simultaneously.

Innovation Solution

A method and apparatus that determine interference between radio frequency test signals for multiple DUTs using disturbance threshold values, allowing simultaneous testing when thresholds are undershot and sequential testing when exceeded, while maintaining high isolation through a central processing unit and signal generation/analysis system.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If multiple DUTs are tested simultaneously in a production environment, then productivity increases, but interference between DUTs causes measurement errors and reduces reliability

Engineering Contradiction:
Improvenumber of DUTs tested simultaneouslyVSAvoidmeasurement accuracy
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The system dynamically changes testing parameters including frequency assignment, power levels, and time slots for each DUT based on real-time interference detection. The central processing unit adjusts these parameters to eliminate interference while maintaining simultaneous testing of multiple DUTs, thus resolving the contradiction between productivity and measurement accuracy.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The testing system transitions from static sequential testing to dynamic simultaneous testing with real-time adaptation. The system continuously monitors interference levels and dynamically reconfigures test parameters, allowing multiple DUTs to be tested concurrently while maintaining measurement reliability through adaptive interference management.

Inventive Principle:
Principle #15Dynamics

2Measurement precision

If electrical isolation between DUTs is increased to avoid interference, then measurement precision improves, but device complexity and production costs increase

Engineering Contradiction:
Improveisolation between DUTsVSAvoidshielding requirements
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The system replaces physical electrical isolation mechanisms (such as shielding and isolation circuits) with software-based interference management. The central processing unit detects and eliminates interference through parameter adjustment and coordination, substituting complex hardware isolation requirements with simpler software control while maintaining measurement precision.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

3Measurement precision

If sequential testing is used to avoid interference, then measurement precision is maintained, but productivity decreases due to increased testing time

Engineering Contradiction:
Improveisolation between DUTsVSAvoidtesting duration
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The system implements periodic interference detection and parameter adjustment during simultaneous testing of multiple DUTs. By continuously monitoring and periodically reconfiguring test parameters, the system maintains measurement precision while keeping all DUTs active throughout the testing process, thereby eliminating the time loss associated with sequential testing.

Inventive Principle:
Principle #19Periodic action

4Measurement precision

If separate testing plans are used for different frequency ranges, then measurement precision is maintained, but device complexity and maintenance difficulty increase

Engineering Contradiction:
Improvefrequency-specific testing accuracyVSAvoidnumber of independent test plans
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The system implements a universal testing framework that can handle multiple frequency ranges and DUT configurations through a single integrated testing plan. The central processing unit dynamically assigns frequency resources and coordinates testing parameters across different DUTs, eliminating the need for separate independent test plans while maintaining frequency-specific measurement precision.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Data Source

PatentUS9991977B2Smart testing management
Publication Date: 2018.06.05 ROHDE & SCHWARZ GMBH & CO KG
  • US9991977B2 patent drawing
  • US9991977B2 patent drawing
  • US9991977B2 patent drawing

AI summary

The invention is related to a smart testing apparatus and preferably a method for testing at least a first DUT and a second DUT using a mobile communications testing device. The method comprises the steps of determining, whether a first RF test signal from/to the first DUT interferes with a second RF test signal from/to the second DUT. It determines, whether the second RF test signal from/to second DUT interferes with the first RF test signal from/to the first DUT. It predetermines, whether at least measuring the first measuring result obtained by applying the first RF test signal is disturbed above a first disturbance threshold value. It predetermines, whether at least a second measuring result obtained by applying the second RF test signal is disturbed above a second disturbance threshold value.