Spatial Modulation of Illumination Microscope Resolution

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Solution Overview

Problem

Conventional microscopes face limitations in spatial resolution due to the finite dimensions of their aperture stop, which restricts the imaging of high spatial frequencies, making it difficult to observe features smaller than the Abbe limit.

Innovation Solution

The implementation of Spatial Modulation of Illumination (SMI) in the illumination system of a microscope, using a spatial light modulator to shift high spatial harmonics outside the microscope's bandwidth, allowing their restoration through demodulation and enhancing the spatial resolution by expanding the microscope's effective bandwidth.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If conventional microscope optics are used, then the imaging system is simple and easy to operate, but the spatial resolution is limited by the Abbe limit due to the finite aperture stop dimensions

Engineering Contradiction:
Improvespatial resolutionVSAvoidillumination system complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

A spatial light modulator is introduced as an intermediary component in the illumination system to generate spatial modulation patterns. This mediator shifts high spatial harmonics outside the microscope's bandwidth, allowing them to be captured and then restored through demodulation, thereby enhancing spatial resolution without requiring changes to the core microscope optics

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The illumination system dynamically changes the spatial frequency parameters of the illumination light by applying different spatial modulation patterns. This parameter change allows the system to shift information about high spatial frequency object features into the passband of the microscope optics, enabling resolution beyond the conventional Abbe limit

Inventive Principle:
Principle #35Parameter changes

2Measurement precision

If the aperture stop dimensions are increased to improve spatial resolution, then high spatial frequencies can be captured, but the device size and complexity increase

Engineering Contradiction:
Improvespatial resolutionVSAvoidaperture stop dimensions
Core Design Contradiction:
Measurement precisionVSLength of stationary object

Solution Approach 1:

Instead of physically increasing the aperture stop dimensions, the system changes the spatial frequency parameters of the illumination light through spatial modulation. This allows high spatial frequency information to be shifted into the existing bandwidth of the microscope optics, achieving enhanced resolution without increasing the physical size of the aperture stop

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent replaces the mechanical approach of increasing aperture size with an optical modulation approach. By using spatial light modulation and digital demodulation, the system achieves equivalent效果 to a larger aperture without the associated increase in device size and complexity

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

3Measurement precision

If spatial modulation of illumination is applied to resolve smaller features, then the spatial resolution is enhanced, but the device complexity and processing requirements increase

Engineering Contradiction:
Improvespatial resolutionVSAvoidprocessing complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The system employs a feedback loop where spatially modulated images are captured, demodulated using knowledge of the applied modulation pattern, and processed to restore high spatial frequency information. This feedback mechanism allows the system to iteratively refine the reconstructed image and achieve enhanced resolution despite the increased processing requirements

Inventive Principle:
Principle #23Feedback

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

SMI enables microscopes to resolve objects 10% to 49% smaller than the Abbe limit, effectively improving the spatial resolution by allowing high spatial harmonics to be passed through and restored, enabling the imaging of smaller features.

Implementation Method 1

an illumination system for forming a spatial modulation pattern on an object to be imaged

Methodology Applied
Scientific EffectSpatial light modulation: Phase Modulation

Implementation Method 2

a microscope optics for imaging the spatially modulated object

Methodology Applied
Scientific EffectOptical imaging: Lens

Implementation Method 3

a spatial demodulator for performing a spatial demodulation which is at least partially matched to the spatial modulation pattern

Methodology Applied
Scientific EffectSpatial demodulation: Homodyne Detection

Data Source

PatentUS8896683B2Device for forming a high-resolution image, imaging system, and method for deriving a high-spatial-resolution image
Publication Date: 2014.11.25 NXP USA INC
  • US8896683B2 patent drawing
  • US8896683B2 patent drawing
  • US8896683B2 patent drawing

AI summary

A device for forming a high-resolution image of an object is provided. The device comprises: an electronic camera for capturing an intermediate image of the object, an illumination system for forming a spatial modulation pattern on the object; and a spatial demodulator for performing a spatial demodulation, which is at least partially matched to the spatial modulation pattern. A method for deriving a high-spatial-resolution image from a set of images captured from a structure of an object is derived, wherein the illumination of the object is spatially-modulated, wherein the illumination of the object has a spatial modulation pattern, which is substantially periodic, wherein one of at least one prevailing orientation of the periodic illumination is arranged substantially perpendicularly to at least one prevailing orientation of the structure of the object.