SoC OTP Test Configuration Using Setting Bits to Cut Chip Use
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Solution Overview
Problem
The high cost and resource consumption associated with testing System on a Chip (SoC) due to its one-time programmable (OTP) memory characteristics, which cannot be overwritten, leading to increased chip consumption during testing and development stages.
Innovation Solution
A System on a Chip (SoC) design incorporating a function register and an OTP memory, where setting bits control the writing of test data into functional bits, reducing the need for multiple OTP memory programming by using setting bits to determine the bit values of functional bits.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If multiple OTP memory configurations are used to test different functions, then testing coverage is improved, but chip consumption increases
Solution Approach 1:
The patent divides the OTP memory into two distinct parts: setting bits and operating bits. The setting bits are configured once to define the test mode, while the operating bits contain the actual test data that can be dynamically accessed. This segmentation allows the same physical chip to support multiple testing scenarios without consuming multiple physical chips, as the setting bits control which operating bits are read during different test phases.
Solution Approach 2:
The patent introduces dynamic control through the setting bits that can be programmed to different values before testing. By changing the setting bit configurations, the system can dynamically switch between different test modes and select different operating bit data for testing. This dynamic reconfiguration capability allows a single chip to serve multiple testing purposes without physical replacement, thereby reducing chip consumption while maintaining comprehensive testing coverage.
2Adaptability or versatility
If OTP memory is programmed multiple times for different test scenarios, then testing flexibility is improved, but manufacturing cost increases
Solution Approach 1:
The patent segments the OTP memory into setting bits and operating bits with distinct functions. The setting bits are programmed once to establish test configuration, while the operating bits store test data that can be read multiple times without changing the setting. This segmentation eliminates the need to reprogram the entire OTP memory for different test scenarios, reducing manufacturing complexity and cost while maintaining testing flexibility.
Solution Approach 2:
The patent applies preliminary action by programming the setting bits before the actual testing begins. The setting bits are configured in advance to define which operating bits will be used for specific test scenarios. This preliminary configuration allows the testing process to proceed efficiently without repeated OTP programming operations, thereby reducing manufacturing cost while preserving the ability to test multiple functions.
3Adaptability or versatility
If physical OTP memory bits are changed for different functions, then functional versatility is improved, but resource consumption increases
Solution Approach 1:
The patent segments the OTP memory into setting bits and operating bits, where only the setting bits undergo physical programming changes, while the operating bits remain static and are simply read differently based on setting bit configurations. This segmentation ensures that the physical resource consumption is limited to the setting bits only, while the functional versatility is achieved through the logical control of operating bits, thereby improving the ratio of functionality to resource consumption.
Solution Approach 2:
The setting bits act as an intermediary between the external test configuration and the operating bits. By programming the setting bits with different values, the system can indirectly control which operating bits are accessed during testing, without physically changing the operating bits themselves. This intermediary mechanism enables functional versatility while minimizing physical resource consumption to only the setting bits.
Data Source
AI summary
A System on a Chip (SoC), a test device for testing the SoC, and a test method for testing the SoC are provided. The SoC includes a function register, a one-time programmable (OTP) memory, and a processor. The function register includes functional bits. The SoC performs a test operation based on data of at least one of the functional bits. The OTP memory includes setting bits and operating bits. When a bit value of a first setting bit among the setting bits is a first value, the SoC writes data coming from a first operating bit among the operating bits to a first functional bit among the functional bits. When the bit value of the first setting bit is the second value, the SoC writes a first bit value of the test data to the first functional bit.