Onboard SoC Self-Diagnostic Testing for Circuit Boards

Solution Overview

Problem

The existing methods for testing complex electronic circuit board assemblies, such as those with System on Chip (SoC) devices, are labor-intensive, costly, and require complex test fixtures, leading to unnecessary delays in production and product release, as they often necessitate extensive external hardware and software setups.

Innovation Solution

A system and method utilizing onboard digital logic and software for self-diagnostic testing, which includes a SoC or similar integrated circuit with multiplexers to switch between internal and external signals, comparing measured values with stored acceptable values to determine functional specifications, and using LEDs or LCDs for pass/fail indications, allowing for automated and cost-effective testing.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If complex test fixtures with extensive external hardware are used for testing embedded systems, then measurement precision and reliability are improved, but device complexity and cost increase significantly

Engineering Contradiction:

Improvetesting reliabilityVSAvoidtest system complexity

Core Design Contradiction:

ReliabilityVSDevice complexity

Solution Approach 1:

The embedded system performs self-diagnostic testing using its own onboard digital logic and software resources. The SoC utilizes its internal processors, memory blocks, timing sources, and peripheral interfaces to conduct functional tests without requiring external test equipment to emulate these components. This self-service approach eliminates the need for complex test fixtures while maintaining testing reliability.

Inventive Principle:

Principle #25Self-service

Solution Approach 2:

The onboard digital logic and software are designed to perform multiple functions: normal system operation and diagnostic testing. The same peripheral interfaces (USB, Ethernet, SPI, I2C) and processing units used during product operation are repurposed for self-testing, eliminating the need for dedicated test hardware and reducing overall system complexity.

Inventive Principle:

Principle #6Universality (Multi-functionality)

2Adaptability or versatility

If complex test fixtures with extensive external hardware are used for testing embedded systems, then functional testing capability is improved, but manufacturing cost and production time increase

Engineering Contradiction:

Improvefunctional testing capabilityVSAvoidmanufacturing cost

Core Design Contradiction:

Adaptability or versatilityVSEase of manufacture

Solution Approach 1:

The embedded system performs self-diagnostic testing using its own onboard digital logic and software resources. The SoC utilizes its internal processors, memory blocks, timing sources, and peripheral interfaces to conduct functional tests without requiring external test equipment to emulate these components. This self-service approach eliminates the need for complex test fixtures while maintaining testing reliability.

Inventive Principle:

Principle #25Self-service

Solution Approach 2:

Diagnostic test routines are pre-loaded into the embedded system's memory during manufacturing. The system is prepared in advance with self-testing capabilities, allowing immediate functional verification without requiring complex external test equipment setup during production or field operations.

Inventive Principle:

Principle #10Preliminary action

3Measurement precision

If traditional test methods with external hardware emulators are used, then functional testing accuracy is improved, but productivity and production speed decrease

Engineering Contradiction:

Improvefunctional testing accuracyVSAvoidproduction speed

Core Design Contradiction:

Measurement precisionVSProductivity

Solution Approach 1:

The embedded system performs self-diagnostic testing using its own onboard digital logic and software resources. The SoC utilizes its internal processors, memory blocks, timing sources, and peripheral interfaces to conduct functional tests without requiring external test equipment to emulate these components. This self-service approach eliminates the need for complex test fixtures while maintaining testing reliability.

Inventive Principle:

Principle #25Self-service

Solution Approach 2:

The patent extracts the testing function from external test equipment and relocates it to the embedded system itself. By removing the dependency on external hardware emulators and placing diagnostic capabilities directly within the SoC, the system achieves both functional testing accuracy and improved production speed.

Inventive Principle:

Principle #2Taking out (Extraction)

Data Source

PatentUS9494651B2Method for testing embedded systems

Publication Date: 2016.11.15 HONEYWELL LTD(CA)

AI summary

Functional diagnostic testing of an electronic circuit board assembly with one or more embedded channels to be tested includes steps of: (a) connecting a channel under test; (b) imposing a known digital or analog voltage, as appropriate for a channel under test, that is generated by a digital or analog output of the electronic circuit board assembly; and (c) comparing data read by the channel under test with the stored value of the imposed voltage and required tolerance to determine whether the channel under test is within specifications. Diagnostic test implemented by digital logic and software residing onboard the electronic circuit board assembly. Execution of software or firmware code segment controls the diagnostic test sequence. Signal switching is facilitated by digital and analog multiplexers.