SoC Test Controller for Storage Read Channel Validation
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Solution Overview
Problem
Existing system-on-chip (SoC) validation methods rely on external validation systems that only test integrated circuit devices independently, failing to assess interactions with other SoC components, leading to incomplete validation and inefficient testing processes.
Innovation Solution
Incorporating a built-in test controller within the storage device controller, which includes drive controller circuitry, read data channel circuitry, test controller circuitry, and selector circuitry to simulate data operations and switch between operational and testing modes, allowing for comprehensive testing of read data channel interactions with other SoC components.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If external validation systems are used to test integrated circuit devices, then the validation process can be performed after fabrication, but the testing is incomplete because it only tests the integrated circuit device itself and not its interactions with other SoC components
Solution Approach 1:
The patent merges the validation system with the SoC by integrating a test controller directly into the SoC architecture. This test controller can switch between operational mode and test mode, allowing the same hardware to serve both functional operations and validation purposes. This eliminates the need for separate external validation systems and enables comprehensive testing of component interactions within the SoC.
Solution Approach 2:
The test controller is designed with multi-functionality, capable of operating in two distinct modes: operational mode for normal data processing and test mode for validation. This universal design allows a single component to perform multiple functions, reducing overall system complexity while maintaining complete validation capabilities.
2Productivity
If external validation systems are used, then testing can be performed, but the testing process is inefficient and time-consuming
Solution Approach 1:
By integrating the test controller within the SoC, the patent eliminates communication overhead and interface complexities associated with external validation systems. The test controller can directly access and test internal components and their interactions without external interfacing, significantly reducing validation time and improving testing efficiency.
Solution Approach 2:
The test controller is pre-integrated into the SoC architecture during fabrication, allowing validation tests to be performed immediately after fabrication without requiring additional external setup or configuration. This preliminary integration enables rapid validation and reduces time-to-market.
Data Source
AI summary
A storage device controller includes drive controller circuitry configured to control writing and fetching of data from a storage medium, read data channel circuitry for interfacing between the drive controller circuitry and the storage medium, test controller circuitry configured to test the read data channel circuitry by issuing test commands simulating the writing and fetching of data from the storage medium, and selector circuitry configured to switchably couple the read data channel circuitry to the drive controller circuitry in an operating mode and to the test controller circuitry in a testing mode. The storage device controller may include a pattern generator configured to output the test commands. Processor circuitry may be configured to store test results in memory, to compute performance metrics from the stored test results, and communicate the performance metrics to a host device.