Socket Testing Using Image Binarization and Grid Alignment
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Solution Overview
Problem
The increasing number of pins and pin density in CPU sockets necessitates more advanced detection methods, as existing equipment is no longer sufficient to meet the detection requirements.
Innovation Solution
A socket testing method and system that involves obtaining a raw socket image, performing binarization, determining pinhead locations, applying a grid with intersections, and outputting a warning signal when the distance between pinheads and intersections exceeds a tolerance value, utilizing a light assembly, image sensor, and processor to facilitate accurate detection.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the number of pins and pin density in CPU socket is increased to support diversified CPU operation functions, then the detection requirement for the CPU socket is increased, but the existing detection equipment is no longer sufficient to meet the detection requirements
Solution Approach 1:
The patent replaces complex mechanical detection equipment with an optical measurement system consisting of a light assembly, image sensor, and processor. The system captures images of the socket and uses image processing algorithms to detect pinhead locations and evaluate their conformity, thereby meeting increased detection requirements without proportionally increasing mechanical equipment complexity
Solution Approach 2:
The patent creates a digital copy of the socket by capturing an image of the physical socket and processing it to generate a binarized socket image with identified pinhead locations. This digital representation allows for automated analysis and comparison against standard socket layouts, enabling precise detection without requiring complex physical measurement tools
2Measurement precision
If the number of pins and pin density is increased, then the detection requirement is increased, but the detection efficiency may be reduced due to the complexity of processing more pin locations
Solution Approach 1:
The patent transforms the detection problem by changing parameters from analyzing individual pin characteristics to evaluating the overall distribution pattern of pinheads. By comparing the actual pinhead distribution against a standard socket layout and calculating deviation distances, the system efficiently handles high pin density scenarios without proportionally increasing processing complexity
Solution Approach 2:
The patent applies a grid with multiple intersections to the binarized socket image, dividing the detection space into discrete regions. This segmentation allows the system to systematically check pinhead locations against reference points, making the detection process scalable and efficient even as pin density increases
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach provides a high detection rate with low false rates and stability, allowing for the identification of abnormal pinhead locations and adaptability to various socket models, while ignoring potential calculation errors from system movement.
Implementation Method 1
The light assembly is configured to illuminate a socket
Implementation Method 2
The image sensor is configured to obtain a raw socket image of the socket
Data Source
AI summary
A socket testing method comprises obtaining a raw socket image, performing binarization on the raw socket image to generate a binarized socket image, determining a plurality of pinhead locations in the binarized socket image, applying a grid with the grid including a plurality of intersections to the binarized socket image, for each of the plurality of pinhead locations, obtaining the distance between the pinhead location and one of the plurality of intersections which is nearest to the pinhead location, and outputting a warning signal associated with the pinhead location when determining that the distance is larger than a tolerance value.