Soft Error Rate Modeling for Fast Program Change Evaluation

Solution Overview

Problem

The existing methods for evaluating the soft error rate in logic semiconductor devices like processors and microcomputers are costly and time-consuming due to the need for repeated neutron irradiation tests with each program change, especially in environments with changing execution programs, and there is no standardized method for evaluating neutron-induced soft errors in these devices.

Innovation Solution

A soft error rate evaluation system that constructs a statistical analysis model based on feature amounts extracted from multiple irradiation tests, allowing for rapid evaluation of soft error rates without repeated neutron irradiation tests by using a statistical analysis model to calculate soft error rates for changed programs.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If repeated neutron irradiation tests are conducted for each program change, then accurate soft error rate evaluation is achieved, but evaluation time and cost increase significantly

Engineering Contradiction:

Improvesoft error rate evaluation accuracyVSAvoidevaluation time

Core Design Contradiction:

Measurement precisionVSLoss of time

Solution Approach 1:

The patent performs neutron irradiation tests in advance with multiple different programs to collect soft error occurrence data before actual product deployment. This preliminary action creates a database of soft error characteristics that can be referenced later without requiring repeated irradiation tests when programs change.

Inventive Principle:

Principle #10Preliminary action

Solution Approach 2:

The patent creates a soft error rate evaluation model that copies the characteristics of actual neutron irradiation effects. Instead of performing physical irradiation tests repeatedly, the system uses simulation models that replicate soft error behavior based on program characteristics, enabling rapid evaluation without time-consuming physical tests.

Inventive Principle:

Principle #26Copying

2Measurement precision

If repeated neutron irradiation tests are conducted for each program change, then accurate soft error rate evaluation is achieved, but evaluation cost increases significantly

Engineering Contradiction:

Improvesoft error rate evaluation accuracyVSAvoidevaluation cost

Core Design Contradiction:

Measurement precisionVSLoss of energy

Solution Approach 1:

The patent performs neutron irradiation tests in advance with multiple different programs to collect soft error occurrence data before actual product deployment. This preliminary action creates a database of soft error characteristics that can be referenced later without requiring repeated irradiation tests when programs change.

Inventive Principle:

Principle #10Preliminary action

Solution Approach 2:

The patent creates a soft error rate evaluation model that copies the characteristics of actual neutron irradiation effects. Instead of performing physical irradiation tests repeatedly, the system uses simulation models that replicate soft error behavior based on program characteristics, enabling rapid evaluation without time-consuming physical tests.

Inventive Principle:

Principle #26Copying

3Reliability

If multiple programs are evaluated through neutron irradiation tests, then comprehensive soft error rate assessment is achieved, but evaluation time extends significantly

Engineering Contradiction:

Improvecomprehensive soft error assessmentVSAvoidevaluation time

Core Design Contradiction:

ReliabilityVSLoss of time

Solution Approach 1:

The patent performs neutron irradiation tests in advance with multiple different programs to collect soft error occurrence data before actual product deployment. This preliminary action creates a database of soft error characteristics that can be referenced later without requiring repeated irradiation tests when programs change.

Inventive Principle:

Principle #10Preliminary action

Solution Approach 2:

The patent creates a universal soft error rate evaluation model that can assess multiple different programs using the same framework. The model analyzes program characteristics such as instruction types, memory access patterns, and execution flow to evaluate soft error rates for any program without requiring separate irradiation tests for each one.

Inventive Principle:

Principle #6Universality (Multi-functionality)

Data Source

PatentUS20250348393A1Soft Error Rate Evaluation System

Publication Date: 2025.11.13 HITACHI LTD

AI summary

To construct a soft error rate evaluation system which quickly evaluates a change in soft error rate due to a program change. The soft error rate evaluation system which evaluates the radiation resistance of electronic equipment includes: (a) a procedure of extracting a first feature amount at the time of execution of each of a plurality of irradiation evaluation programs from the plurality of irradiation evaluation programs and their program input conditions; (b) a statistical analysis modeling procedure of performing statistical analysis modeling from the first feature amount of each of the plurality of irradiation evaluation programs and a soft error rate for each of the plurality of irradiation evaluation programs obtained in a neutron irradiation test conducted in advance, to generate a statistical analysis model; (c) a procedure of extracting a second feature amount at the time of execution of an evaluation target program from the evaluation target program and its program input conditions; and (d) a soft error rate calculation procedure of calculating a soft error rate of the evaluation target program from the second feature amount of the evaluation target program by using the statistical analysis model.