Solar Installation Analyzer With Internal Switching for Safer Testing
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Solution Overview
Problem
Conventional solar installation testing methods require multiple reconnections of test leads, which are time-consuming and hazardous, often leading to incomplete safety tests and potential safety risks.
Innovation Solution
A test device with firmware-controlled switches that dynamically couple input terminals to internal measurement circuits, allowing for complete Category 1 and Category 2 testing without reconnection of test leads, enhancing safety and productivity.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of operation
If conventional testing methods are used with multiple test lead reconnections, then different measurement points can be accessed, but testing time increases and technician safety is compromised due to repeated access to hazardous areas
Solution Approach 1:
The patent implements dynamic internal switching within the test device that automatically reconfigures measurement circuits based on the selected test type. The firmware-controlled switches dynamically electrically couple different input terminals to respective internal measurement circuits, enabling the device to adapt its internal configuration without requiring external test lead reconnections by the technician.
Solution Approach 2:
The test device performs self-reconfiguration of its internal measurement circuits through firmware-controlled switching. The device automatically adapts its internal connectivity to match the required measurement configuration based on the selected test type, eliminating the need for technician intervention to manually reconnect test leads between different measurement points.
2Reliability
If multiple test lead reconnections are performed to access different measurement points, then complete testing can be achieved, but the complexity of the testing procedure increases
Solution Approach 1:
The patent implements dynamic internal switching within the test device that automatically reconfigures measurement circuits based on the selected test type. The firmware-controlled switches dynamically electrically couple different input terminals to respective internal measurement circuits, enabling the device to adapt its internal configuration without requiring external test lead reconnections by the technician.
Solution Approach 2:
The patent changes the electrical connectivity parameters within the test device through firmware-controlled switching. By dynamically altering which input terminals are coupled to which measurement circuits, the device achieves different measurement configurations without physical reconnection, thereby maintaining testing completeness while reducing procedural complexity.
3Adaptability or versatility
If test leads are repeatedly connected and disconnected during testing, then all measurement points can be accessed, but the risk of accidents in hazardous environments increases
Solution Approach 1:
The patent implements dynamic internal switching within the test device that automatically reconfigures measurement circuits based on the selected test type. The firmware-controlled switches dynamically electrically couple different input terminals to respective internal measurement circuits, enabling the device to adapt its internal configuration without requiring external test lead reconnections by the technician.
Solution Approach 2:
The test device performs self-reconfiguration of its internal measurement circuits through firmware-controlled switching. The device automatically adapts its internal connectivity to match the required measurement configuration based on the selected test type, eliminating the need for technician intervention to manually reconnect test leads between different measurement points.
Data Source
AI summary
A test device for testing an electrical circuit includes input terminals connectable by test leads to different test points of the electrical circuit; at least first and second measurement circuits; switches; a processor; and a storage medium storing instructions that, when executed by the processor, cause the test device to perform a first test of the electrical circuit while one or more of the switches electrically couples at least first and second ones of the input terminals to the first measurement circuit, and perform a second test of the electrical circuit while one or more of the switches electrically couples at least third and fourth ones of the input terminals the second measurement circuit, where the first and second tests are performed without changing connections of the input terminals of the test device to the different test points of the electrical circuit.


