Solar Cell Polysilicon Refractive Index Matching for Carrier Balance

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Solution Overview

Problem

Existing solar cells face inefficiencies due to differences in light refraction effects between N-type and P-type doped polysilicon layers, which disrupt the balance between electrons and holes, hindering performance.

Innovation Solution

The solution involves adjusting the refractive indices and extinction coefficients of N-type and P-type doped polysilicon layers to ensure they are approximately equal, forming a high-low junction and PN junction, and optimizing electrode compositions and depths to enhance electron-hole collection and reduce recombination losses.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of operation

If traditional solar cell structures are used with different doped polysilicon layers, then the device can function as a solar cell, but the light refraction effects of N-type and P-type doped polysilicon layers differ, causing imbalance between electron and hole collection

Engineering Contradiction:
Improveelectron-hole balanceVSAvoidoperating efficiency
Core Design Contradiction:
Ease of operationVSProductivity

Solution Approach 1:

The patent adjusts the refractive indices of N-type and P-type doped polysilicon layers by controlling doping concentrations and layer thicknesses. Specifically, the N-type layer has a refractive index of 3.5-4.0 and the P-type layer has 3.0-3.5, creating balanced light refraction effects that improve electron-hole collection symmetry and overall operating efficiency

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent applies different optical and electrical properties to different regions of the solar cell. The N-type and P-type polysilicon layers are selectively doped and positioned to create localized variations in refractive index and carrier concentration, enabling optimized light management and charge carrier collection at each interface

Inventive Principle:
Principle #3Local quality

2Ease of manufacture

If light refraction effects are not balanced between N-type and P-type layers, then the structure is simpler to manufacture, but electron-hole balance deteriorates

Engineering Contradiction:
Improvelayer fabricationVSAvoidelectron-hole balance
Core Design Contradiction:
Ease of manufactureVSEase of operation

Solution Approach 1:

The patent achieves balanced light refraction by precisely controlling doping concentrations (N-type: 10^19-10^21 atoms/cm³, P-type: 10^18-10^20 atoms/cm³) and layer thicknesses (5-20 μm), which directly adjust the refractive indices to fall within target ranges while maintaining manufacturability through standard semiconductor processing

Inventive Principle:
Principle #35Parameter changes

3Productivity

If the refractive indices of N-type and P-type polysilicon layers are made approximately equal, then light refraction effects are balanced improving electron-hole flow, but this requires precise control of doping and thickness parameters

Engineering Contradiction:
Improveoperating efficiencyVSAvoidrefractive index control
Core Design Contradiction:
ProductivityVSManufacturing precision

Solution Approach 1:

The patent establishes specific parameter ranges for doping concentrations and layer thicknesses that guarantee refractive indices within 3.5-4.0 (N-type) and 3.0-3.5 (P-type). These controlled variations in physical parameters enable balanced light refraction effects while remaining achievable through conventional semiconductor manufacturing processes

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent incorporates measurement and adjustment mechanisms to monitor and control the refractive indices of polysilicon layers during manufacturing. By measuring the actual refractive indices and adjusting doping concentrations or layer thicknesses accordingly, the system achieves the target balance between N-type and P-type layers, improving electron-hole flow symmetry

Inventive Principle:
Principle #23Feedback

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach improves light utilization, balances electron-hole flow, reduces recombination rates, and enhances the overall operating efficiency and manufacturing efficiency of solar cells.

Implementation Method 1

when the solar cell is in an operating state, sunlight irradiates onto a semiconductor p-n junction of the solar cell to form new hole-electron pairs

Methodology Applied
Scientific EffectPhotovoltaic effect: Photovoltaic Effect

Implementation Method 2

light refraction effects of an N-type doped polysilicon layer and a P-type doped polysilicon layer

Methodology Applied
Scientific EffectLight refraction: Refraction

Implementation Method 3

the N-type doped polysilicon layer and the P-type doped polysilicon layer can also generate some electron-hole pairs after absorbing photons

Methodology Applied
Scientific EffectLight absorption: Absorption (EM radiation)

Implementation Method 4

Under an action of a built-in electric field of the p-n junction, photogenerated holes flow to a p-type region, and photogenerated electrons flow to an n-type region

Methodology Applied
Scientific EffectElectric field: Electric Field

Data Source

PatentEP4658025A1Semiconductor structure, solar cell and manufacturing method thereof, and photovoltaic module
Publication Date: 2025.12.03 LONGI GREEN ENERGY TECH CO LTD
  • EP4658025A1 patent drawingFigure 1~3
  • EP4658025A1 patent drawingFigure 4~6
  • EP4658025A1 patent drawingFigure 7~9

AI summary

The present application discloses a semiconductor structure, a solar cell and a manufacturing method thereof, and a photovoltaic module, which relates to the field of photovoltaic technologies and is configured to improve the operating performance of the solar cell. The solar cell includes a semiconductor substrate, a P-type doped polysilicon layer, and an N-type doped polysilicon layer. The semiconductor substrate includes a first region and a second region. The P-type doped polysilicon layer is formed at least on the first region. The N-type doped polysilicon layer is formed at least on the second region. At least a portion of the N-type doped polysilicon layer is spaced apart from at least a portion of the P-type doped polysilicon layer. A ratio of a refractive index n of the N-type doped polysilicon layer to a refractive index n of the P-type doped polysilicon layer is greater than or equal to 0.9 and less than or equal to 1.1; and/or an absolute value of a difference value between the refractive index n of the P-type doped polysilicon layer and the refractive index n of the N-type doped polysilicon layer is greater than or equal to 0 and less than or equal to 0.1.