Solar Cell Measuring Apparatus with Patterned Probe Card

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Solution Overview

Problem

Conventional solar cell measuring apparatuses face challenges in accurately aligning pins with electrode portions of solar cells, especially when electrode widths and pitches are small, leading to difficulties in measuring current and voltage characteristics without causing damage.

Innovation Solution

A solar cell measuring apparatus with a measuring unit featuring first and second measuring members that come into close contact with the solar cell surface, allowing precise measurement of current, designed to accommodate electrodes located on one surface and with small widths and pitches, using a plate-shaped support member and patterned measuring portions to ensure accurate contact and minimize damage.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If conventional measuring apparatuses with pins are used to measure solar cells with small electrode widths and pitches, then the measurement capability is limited, but the alignment accuracy between pins and electrode portions deteriorates

Engineering Contradiction:
Improvealignment accuracyVSAvoidmeasurement capability
Core Design Contradiction:
Measurement precisionVSAdaptability or versatility

Solution Approach 1:

The patent replaces the conventional mechanical pin-based contact system with a probe card system featuring patterned contact portions. These contact portions are designed with specific geometries (line shapes, dot shapes, or combined patterns) that can be precisely patterned on the probe card surface, enabling accurate alignment with small electrode portions without relying on mechanical pin positioning.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The patent changes the contact interface parameters by using flat patterned contact portions instead of point-contact pins. The contact portions can be designed with optimized dimensions and shapes that match the electrode pitch and width, allowing adaptation to various electrode configurations while maintaining measurement precision.

Inventive Principle:
Principle #35Parameter changes

2Adaptability or versatility

If pins are positioned closer together to measure small electrode pitches, then the measurement adaptability improves, but the device complexity increases

Engineering Contradiction:
Improvemeasurement adaptabilityVSAvoiddevice complexity
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The patent creates a universal probe card design where a single card with patterned contact portions can measure solar cells with various electrode configurations. By changing the probe card rather than the fundamental measurement system, the apparatus can adapt to different electrode pitches and widths, reducing overall system complexity while maintaining versatility.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The patent segments the measurement system into modular components: a standardized measurement apparatus body and interchangeable probe cards with different contact patterns. This allows the complex adaptation requirements to be handled by selecting appropriate probe cards rather than redesigning the entire measurement system.

Inventive Principle:
Principle #1Segmentation

3Ease of manufacture

If electrodes are located only on one surface of the solar cell, then the device structure is simplified, but the measurement applicability of conventional apparatuses deteriorates

Engineering Contradiction:
Improvedevice structureVSAvoidmeasurement applicability
Core Design Contradiction:
Ease of manufactureVSAdaptability or versatility

Solution Approach 1:

The patent inverts the conventional measurement approach by designing the probe card to contact the solar cell from the electrode surface side rather than requiring contact from both sides. This allows accurate measurement of single-sided electrode structures by positioning the patterned contact portions directly over the electrodes on the accessible surface.

Inventive Principle:
Principle #13The other way round (Inversion)

Data Source

PatentEP2881994B1Solar cell measuring apparatus
Publication Date: 2018.02.14 LG ELECTRONICS INC
  • EP2881994B1 patent drawingFigure 1
  • EP2881994B1 patent drawingFigure 2
  • EP2881994B1 patent drawingFigure 3

AI summary

Discussed is a solar cell measuring apparatus to measure a current of a solar cell having a photoelectric converter and first and second electrodes electrically insulated from each other, both the first and second electrodes being located at one surface of the photoelectric converter. The solar cell measuring apparatus includes a measuring unit which includes a first measuring member corresponding to the first electrode and a second measuring member corresponding to the second electrode, wherein the first and second measuring members comes into close contact with the solar cell at the surface of the photoelectric converter to measure the current of the solar cell.