High Throughput Solar Cell UV Degradation Testing

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Solution Overview

Problem

Current methods for photovoltaic UV degradation testing of solar cells are inefficient, requiring long analysis times and being prone to instabilities such as UV-LED light-source intensity variations and temperature fluctuations, which affect the accuracy and throughput of UV degradation measurement systems.

Innovation Solution

The implementation of high throughput solar cell testing apparatuses with multiple RTUV modules, each equipped with a UV light source, optics for focused light application, and detectors for photoluminescence measurement, along with additional features like sheet resistance measurement modules and electronic systems for real-time monitoring and calibration, enables rapid and accurate UV degradation assessment.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If traditional UV degradation testing methods are used, then measurement accuracy is maintained, but analysis time is excessively long and throughput is low

Engineering Contradiction:

Improvetesting throughputVSAvoidanalysis time

Core Design Contradiction:

ProductivityVSLoss of time

Solution Approach 1:

The system divides the UV testing process into multiple parallel RTUV modules, each capable of independently testing solar cells. This segmentation allows simultaneous testing of multiple cells, dramatically increasing throughput while maintaining measurement accuracy through consistent photoluminescence-based detection methodology

Inventive Principle:

Principle #1Segmentation

Solution Approach 2:

The patent replaces traditional mechanical/electrical measurement systems with optical-based photoluminescence detection. By using light emission characteristics to assess UV degradation, the system achieves rapid measurement without the time-consuming electrical characterization methods, reducing analysis time from weeks to minutes

Inventive Principle:

Principle #28Mechanics substitution (Replace mechanical system)

2Device complexity

If UV-LED light sources are used for testing, then device complexity is reduced, but light-source intensity variations cause measurement instability

Engineering Contradiction:

Improvesystem simplicityVSAvoidmeasurement consistency

Core Design Contradiction:

Device complexityVSReliability

Solution Approach 1:

The system incorporates real-time monitoring of UV-LED light source intensity through photoluminescence signal feedback. By continuously measuring the emitted light characteristics and comparing against reference values, the system detects and compensates for intensity variations, maintaining measurement reliability despite using simple UV-LED sources

Inventive Principle:

Principle #23Feedback

Solution Approach 2:

The patent monitors and adjusts measurement parameters based on UV-LED intensity variations. By changing the reference photoluminescence thresholds and exposure parameters dynamically according to actual light source performance, the system maintains consistent measurement accuracy while using low-complexity UV-LED components

Inventive Principle:

Principle #35Parameter changes

3Measurement precision

If conventional testing procedures are followed, then measurement accuracy is preserved, but temperature fluctuations affect results

Engineering Contradiction:

ImproveUV degradation measurement accuracyVSAvoidtemperature stability

Core Design Contradiction:

Measurement precisionVSTemperature

Solution Approach 1:

The patent introduces photoluminescence emission as an intermediary measurement parameter that is less sensitive to temperature fluctuations than direct electrical measurements. By measuring light emission rather than electrical properties directly, the system achieves temperature-resilient UV degradation assessment while maintaining measurement precision through optical detection

Inventive Principle:

Principle #24Intermediary (Mediator)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach significantly reduces UV degradation measurement time from weeks to minutes, allowing for increased sampling rates and more consistent results, while mitigating the effects of temperature and light-source intensity variations, thereby enhancing the efficiency and reliability of solar cell manufacturing processes.

Implementation Method 1

applying a first light to a sample region of a solar cell or a partially fabricated solar cell to induce a photonic degradation in the sample region

Methodology Applied

Scientific EffectPhotonic degradation: Photo-oxidation

Implementation Method 2

A detector is included and is configured to measure photoluminescence induced from the applied light of the first wavelength

Methodology Applied

Scientific EffectPhotoluminescence: Photoluminescence

Data Source

PatentUS10476432B2High throughput system for photovoltaic UV degradation testing

Publication Date: 2019.11.12 MAXEON SOLAR PTE LTD

AI summary

High throughput systems for photovoltaic UV degradation testing of solar cells, and methods of testing for UV degradation of solar cell during manufacture, are described herein. In an example, a high throughput solar cell testing apparatus includes a plurality of real time ultra-violet (RTUV) testing modules. Each of the RTUV testing modules includes an ultra-violet (UV) light source, an optics assembly for focusing light from the UV light source on a sample area, and a detector for receiving photoluminescence energy from the sample area. The high throughput solar cell testing apparatus also includes an acquisition and control assembly coupled to the plurality of RTUV testing modules.