Solar Concentrator Surface Measurement Using Reflected Patterns
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Solution Overview
Problem
Current methods for measuring solar thermal concentrators are either insufficiently precise, time-consuming, or limited to small areas, making it difficult to accurately assess the quality and efficiency of large mirror surfaces in solar thermal power plants.
Innovation Solution
A method that uses reflected patterns to determine surface normals and gradients on the concentrator surfaces, allowing for two-dimensional evaluation and high-resolution measurements of local gradients with minimal time and material expenditure, using a simple target like a printed plate and computer image evaluation.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Area of stationary object
If a large-area target is attached to the concentrator for measurement, then measurement coverage is improved, but cost and device complexity increase significantly
Solution Approach 1:
The patent uses a simple printed plate with pattern as a target instead of a complex large-area target. The pattern on the plate is reflected by the concentrator surface and captured by a camera, creating an optical copy that enables measurement without requiring physical attachment of complex measurement equipment to the concentrator surface.
Solution Approach 2:
The measurement target is implemented as a simple printed plate that can be easily manufactured and replaced. This disposable-like approach eliminates the need for expensive, complex, and durable target attachments, significantly reducing measurement system cost while maintaining measurement capability.
2Measurement precision
If traditional measurement methods are used for large concentrator areas, then measurement completeness is improved, but measurement time increases significantly
Solution Approach 1:
The patent captures the entire concentrator surface reflection in a single two-dimensional camera image, transitioning from sequential point-by-point or line-by-line measurement to simultaneous area-wide measurement. This dimensional approach allows complete coverage of large concentrator surfaces without time-consuming sequential scanning.
Solution Approach 2:
The measurement system is pre-configured with a camera positioned at the focal point and a patterned plate at a known distance. This preliminary setup enables direct calculation of surface normals and gradients from the captured image without requiring time-consuming iterative measurements or adjustments during the actual measurement process.
3Ease of operation
If qualitative image comparison is used for mirror adjustment, then ease of operation is improved, but quantitative measurement capability deteriorates
Solution Approach 1:
The patent transforms the measurement from qualitative image comparison to quantitative parameter extraction by calculating surface normals and gradients from the reflected pattern geometry. The known pattern dimensions and camera position enable mathematical computation of precise surface parameters, providing both ease of operation through automated calculation and high measurement precision through quantitative data.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables accurate, fast, and economical measurement of large concentrator areas, providing quantitative data on slope errors and tilting, which can be used for precise adjustment and optimization of solar thermal power plants.
Implementation Method 1
a camera (22) which is arranged behind the target (20) in such a way that the image of the target reflected by the concentrator (10) falls onto the camera
Data Source
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AI summary
The method involves allocation of the structure visible in the image with the coordinates of the target (20) in the source image. Calculating the determination of the normal surface for the reflection plane at different positions of the concentrator (10) from the clear allocation of the mapped structures. Comparisons of the upward gradients of the normal surface with the target gradient of an ideal form of the concentrator.