Solar Panel Infrared Defect Detection for Microcracks and Hotspots

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Solution Overview

Problem

Conventional methods for detecting defects in solar panels, such as manual inspections and imaging techniques, are inefficient, labor-intensive, and lack accuracy, particularly in identifying microcracks and early-stage hotspots, which can worsen over time and reduce the performance of solar power plants.

Innovation Solution

A method and system using a You Only Look Once Series—Photovoltaic (YOLOS-PV) convolutional neural network with a pretrained vision transformer and a transformer block encoder to process infrared images from solar panels, applying position embedding, generating detection tokens, and classifying defects with multi-layer perceptron heads, utilizing a weighted loss combination of GIoU and L1 regression loss for precise defect detection.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If manual inspection is used to detect defects in solar panels, then reliable assessment can be provided, but the process becomes time-consuming and labor-intensive

Engineering Contradiction:
Improvedefect detection reliabilityVSAvoidinspection time
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The patent replaces manual mechanical inspection with an automated imaging system that captures photographs of solar panels and uses machine learning algorithms to detect defects. The system substitutes human visual inspection with computational image analysis, achieving both high reliability and efficiency simultaneously.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

2Reliability

If conventional thermal and electrical modeling is used to assess solar panel performance, then temperature variations and power output can be analyzed, but structural defects like microcracks cannot be identified

Engineering Contradiction:
Improveperformance assessment capabilityVSAvoidstructural defect detection capability
Core Design Contradiction:
ReliabilityVSDifficulty of detecting and measuring

Solution Approach 1:

The patent creates a multi-functional defect detection system that can identify multiple types of defects simultaneously - both functional defects (hotspots, performance issues) and structural defects (cracks, broken glass) - using a single integrated imaging and machine learning platform, eliminating the need for separate specialized equipment.

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Measurement precision

If advanced imaging techniques such as Electroluminescence or Infrared Thermography are used for defect detection, then enhanced visibility of defects can be achieved, but the techniques require specialized equipment and controlled conditions

Engineering Contradiction:
Improvedefect detection accuracyVSAvoidequipment complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent uses standard digital cameras or smartphones to capture images of solar panels, replacing expensive specialized imaging equipment like Electroluminescence or Infrared Thermography systems. The approach uses readily available, inexpensive devices combined with advanced software algorithms to achieve comparable or superior detection accuracy.

Inventive Principle:
Principle #27Cheap short-living objects (Disposable)

4Measurement precision

If signal processing techniques such as wavelet transform are applied to enhance defect detection, then computational analysis can be improved, but the techniques involve high computational costs and lack generalization

Engineering Contradiction:
Improvedefect detection precisionVSAvoidcomputational energy consumption
Core Design Contradiction:
Measurement precisionVSUse of energy by moving object

Solution Approach 1:

The patent applies pre-trained machine learning models that have already learned defect patterns during an offline training phase. During actual inspection, the pre-trained model quickly processes images without requiring intensive real-time computation, achieving both high precision and low energy consumption during deployment.

Inventive Principle:
Principle #10Preliminary action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The YOLOS-PV convolutional neural network enhances defect detection accuracy and automation, effectively identifying various defects in solar panels, reducing false positives, and ensuring timely maintenance for improved efficiency and longevity.

Implementation Method 1

collecting, by a thermal camera on at least one imaging drone navigating over at least one mounted and operational solar panel, an image dataset of infrared images

Methodology Applied
Scientific EffectInfrared radiation detection: Infrared Radiation

Data Source

PatentUS12494740B1Method and system for detecting defects in solar panels
Publication Date: 2025.12.09 KING FAHD UNIVERSITY OF PETROLEUM AND MINERALS
  • US12494740B1 patent drawing
  • US12494740B1 patent drawing
  • US12494740B1 patent drawing

AI summary

A method and a system for detecting defects in solar panels. The method includes collecting an image dataset of infrared images of the at least one mounted and operational solar panel; applying the image dataset to a YOLOS-PV convolutional neural network; converting the image dataset to a set of patches; applying position embedding to each patch and generating a set of position embedded patches; applying the set of position embedded patches to a transformer block encoder; generating a set of detection tokens; applying the set of detection tokens to an array of multi-layer perceptron (MLP) heads; classifying defects in the position embedded patches; setting, by the MLP heads, a plurality of Bpred bounding boxes for each of the set of position embedded patches; and identifying a solar panel in need of repair based on the defects in the set of position embedded patches and the plurality of Bpred bounding boxes.