Solid Block Measurement Light Source for Uniform Illumination
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Solution Overview
Problem
Existing measurement light sources with integrating spheres suffer from significant measurement errors (>1%) when sample spacing changes or the sample is tilted, making them unsuitable for inline measurements in production processes.
Innovation Solution
A compact measurement light source with a solid block design featuring an illumination space, light shaping space, and light exit space, all with diffusely reflective surfaces, where light is reflected multiple times to maintain uniform spatial illuminance distribution, allowing for tolerance of sample distance variance and tilting.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Illumination intensity
If an integrating sphere is used as a homogenizer, then uniform spatial illuminance distribution is achieved, but measurement errors exceed 1% when sample spacing changes or sample is tilted
Solution Approach 1:
The integrating sphere is divided into multiple functional zones: an illumination zone with a first diffusely reflective surface, a light-shaping zone with a second diffusely reflective surface, and a light exit zone with a third diffusely reflective surface. Each zone performs a specific function in light distribution and shaping, collectively achieving uniform illuminance while maintaining measurement precision against sample spacing and tilting variations.
2Illumination intensity
If an integrating sphere is used, then uniform spatial illuminance distribution is achieved, but the device complexity and size increase
Solution Approach 1:
The illumination zone, light-shaping zone, and light exit zone are merged into a single integrated optical system with continuously varying surface properties. The diffusely reflective surfaces are arranged in sequence to perform multiple functions (illumination, light shaping, and light exit) within one compact structure, eliminating the need for separate integrating sphere components and reducing overall device complexity.
3Illumination intensity
If an integrating sphere is used, then uniform spatial illuminance distribution is achieved, but the device volume increases
Solution Approach 1:
The optical system utilizes three-dimensional spatial arrangement of the illumination zone, light-shaping zone, and light exit zone with continuously varying surface properties in different directions. This multi-dimensional light distribution approach achieves uniform illuminance without requiring a large spherical volume, allowing for a more compact device design.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution achieves a deviation of at most 0.2% in spatial illuminance distribution, enabling accurate inline measurements of absolute reflection spectra without the need for a reference sample.
Implementation Method 1
The illumination space, the light shaping space, and the light exit space each have a diffusely reflective inner surface for generating or passing on diffuse light
Data Source
AI summary
The present invention relates to a measurement light source for generating measurement light with a uniform spatial illumination intensity distribution. The measurement light source comprises a solid block, in which an illumination space, a light-forming space and a light exit space are each formed as a hollow space in the block and have a diffusely reflecting inner surface. The illumination space opens into the light-forming space. The light-forming space opens into the light exit space. At least one light source is at least partially arranged in the illumination space in order to generate light. The light exit space has a light exit. According to the invention, an axis of the illumination space and an axis of the light exit space are arranged at a distance from one another. The light-forming space is designed for a reversal of a light propagation direction. The invention also relates to a measuring arrangement for detecting at least an absolute reflection spectrum of a sample. The measuring arrangement is used in particular for the spectroscopic examination of surfaces in production processes in order to determine the color or gloss of surfaces, for example.