Solid Electrolyte Characterization of Perovskite Semiconductor Films

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Solution Overview

Problem

Current methods for analyzing metal halide perovskites in optoelectronic devices face challenges due to low sensitivity and the difficulty of solvent-based electrochemical analysis, as these materials are soluble in most solvents, and there is a need for more detailed in situ and operando characterization during manufacturing and operation to address defects and interfacial interactions.

Innovation Solution

A method using a solid electrolyte comprising a polymer and ionic liquid for solvent-free electrochemical analysis, combined with spectroscopic techniques, to determine defect concentrations and energetics in metal halide perovskites, allowing for real-time characterization of semiconductor materials and devices under various stress conditions.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If conventional electrochemical analysis methods are used, then detection sensitivity is improved, but solvent-based analysis becomes problematic because metal halide perovskites are soluble in most solvents

Engineering Contradiction:
Improvedetection sensitivityVSAvoidsolvent solubility issue
Core Design Contradiction:
Measurement precisionVSObject-affected harmful factors

Solution Approach 1:

The invention changes the physical state of the electrolyte from liquid to solid by using a solid polymer electrolyte. This parameter change eliminates the solvent solubility problem while maintaining electrochemical analysis capability, as the solid electrolyte does not dissolve the perovskite material.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The invention replaces the liquid solvent-based electrochemical system with a solid polymer electrolyte system. This substitution maintains the electrochemical analysis function while eliminating the harmful solvent interaction with the perovskite material.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

2Reliability

If in situ and operando characterization methods are implemented, then real-time analysis during manufacturing and operation is achieved, but device complexity and analysis system requirements increase

Engineering Contradiction:
Improvereal-time characterization capabilityVSAvoidanalysis system complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The solid polymer electrolyte serves multiple functions: it acts as the electrolyte medium for electrochemical analysis, provides mechanical support for the thin film, and enables both in situ and operando characterization modes. This multi-functionality reduces overall system complexity.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The solid polymer electrolyte acts as an intermediary layer that enables contact between the perovskite thin film and the electrochemical measurement system without requiring complex solvent handling or specialized equipment, simplifying the analysis system.

Inventive Principle:
Principle #24Intermediary (Mediator)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables detailed characterization of defect concentrations and energetics in metal halide perovskites, improving the stability and efficiency of optoelectronic devices by providing a solvent-free, operando analysis that can assess material properties under real-world conditions, enhancing defect reduction and device performance.

Implementation Method 1

solid electrolyte comprising a polymer and ionic liquid for solvent-free electrochemical analysis

Methodology Applied
Scientific EffectIon conduction: Conduction (electrical)

Implementation Method 2

combined with spectroscopic techniques, to determine defect concentrations and energetics

Methodology Applied
Scientific EffectSpectroscopy: Absorption Spectroscopy

Data Source

PatentUS20240264113A1Device and methods for characterization of semiconductor films
Publication Date: 2024.08.08 THE ARIZONA BOARD OF REGENTS ON BEHALF OF THE UNIV OF ARIZONA
  • US20240264113A1 patent drawing
  • US20240264113A1 patent drawing
  • US20240264113A1 patent drawing

AI summary

An apparatus for characterizing a substructure of a semiconductor device includes a potentiostat; a counter electrode electrically connected to the potentiostat; a solid electrolyte attached to a surface of the counter electrode; a reference electrode embedded within at least a portion of the solid electrolyte and electrically connected to the potentiostat; and a probe electrically connected to the potentiostat. The solid electrolyte includes a solid porous material and an ionic liquid disposed within the solid porous material. A method of characterizing a substructure of a semiconductor device includes contacting at least a portion of a surface of the substructure of the semiconductor device with a second surface of a solid electrolyte.