Solid-State Fiber Inspection System Wavelength Mode Switching
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Solution Overview
Problem
Existing inspection systems for fiber endfaces and connectors face challenges in efficiently switching between interference fringe imaging and microscope imaging modes without using movable parts that can wear out, affecting the accuracy and reliability of surface geometry and quality measurements.
Innovation Solution
A multifunction inspection system utilizing solid-state optical components that emit different wavelengths of light for interference fringe imaging and microscope imaging modes, with a beam splitter and wavelength-specific light absorbing filter to direct and block reference beams, eliminating the need for movable parts.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If movable parts are used to switch between interference fringe imaging and microscope imaging modes, then mode switching capability is achieved, but reliability deteriorates due to wear and tear
Solution Approach 1:
The patent replaces movable mechanical parts with solid-state optical components. Specifically, it uses a beam splitter with different optical properties for different wavelengths, combined with fixed light sources emitting at different wavelengths, to achieve mode switching without any moving parts. This substitution of mechanical switching with wavelength-based optical routing eliminates wear and tear while maintaining mode switching capability.
Solution Approach 2:
The patent changes the wavelength parameter of light to switch between imaging modes. By using light sources that emit at different wavelengths and a beam splitter that directs different wavelengths along different paths, the system achieves mode switching through parameter changes rather than mechanical movement. This approach maintains reliability while providing adaptability.
2Reliability
If solid-state optical components are used to eliminate movable parts, then reliability is improved, but device complexity increases due to multiple optical components
Solution Approach 1:
The beam splitter serves multiple functions: it splits light based on wavelength, directs different wavelengths to different imaging paths, and enables both interference fringe imaging and microscope imaging modes within a single component. This multi-functionality reduces the need for separate components for each mode, thereby reducing overall device complexity while maintaining reliability through the use of solid-state components.
3Adaptability or versatility
If different wavelengths of light are used for different imaging modes, then adaptability is improved, but measurement precision may deteriorate due to wavelength-specific optical path requirements
Solution Approach 1:
The patent segments the optical path into wavelength-specific paths using a beam splitter. Each wavelength is directed along its designated path with appropriate optical components optimized for that wavelength. This segmentation ensures that each imaging mode operates with optimized optical parameters, maintaining measurement precision while enabling versatility through wavelength-based mode differentiation.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables accurate and reliable determination of geometry, topography, and surface quality of fiber endfaces and connectors by maintaining high precision and reducing wear and tear on the inspection system.
Implementation Method 1
interferometers utilize principles of optical interference to generate a fringe pattern representing the surface profile being inspected
Implementation Method 2
The wavelength-specific light absorbing filter absorbs the reference beam of the second wavelength of light, but allows the reference beam of the first wavelength to pass to the reference surface
Data Source
AI summary
An inspection system includes optical components for operating the inspection system in an interference fringe imaging mode and a microscope imaging mode. The inspection system further includes at least one optical light source configured to emit a first wavelength of light to operate the inspection system in the interference fringe imaging mode and configure to emit a second wavelength of light to operate the inspection system in the microscope mode. The first wavelength of light is different from the second wavelength of light.


