Solid-State Imaging Device Segmented Optical Layers
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Solution Overview
Problem
Existing solid-state imaging devices face challenges in accurately detecting visible light due to noise from infrared light, and the addition of near-infrared functionality increases production costs with the need for both visible and infrared pass filters.
Innovation Solution
A solid-state imaging device is designed with a first optical layer that transmits visible and near-infrared light and a second optical layer that absorbs near-infrared light, using specific compounds to achieve selective transmission and absorption characteristics, minimizing noise and production costs.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If both visible pass filter and infrared pass filter are provided to enable both visible light detection and near-infrared detection, then dual functionality is achieved, but production costs increase
Solution Approach 1:
The pixel array is segmented into first pixel regions with only the first optical layer for visible light detection, and second pixel regions with both first and second optical layers for near-infrared detection. This segmentation allows each region to have only the filters it needs, eliminating the cost of providing both filters to all pixels while maintaining dual functionality across the device.
Solution Approach 2:
Different optical filter configurations are applied to different regions of the pixel array based on local detection needs. The first pixel regions have simplified optics for visible light, while the second pixel regions have the additional second optical layer for near-infrared detection, optimizing both cost and performance for each local function.
2Measurement precision
If only first optical layer is provided to reduce production costs, then near-infrared noise in visible light detection increases, but if both optical layers are provided, detection accuracy improves
Solution Approach 1:
The pixel array is divided into regions with different optical filter configurations. First pixel regions have only the first optical layer and are optimized for visible light detection, while second pixel regions have both optical layers for near-infrared detection, allowing each region to achieve appropriate detection accuracy without incurring the full cost of dual filters everywhere.
Solution Approach 2:
The optical filter configuration is tailored to local detection requirements. Regions requiring high visible light detection accuracy have the simpler first optical layer, while regions requiring near-infrared detection capability have the additional second optical layer, optimizing the balance between detection accuracy and manufacturing cost.
3Measurement precision
If infrared pass filter is added to block near-infrared light from reaching RGB pixel array, then visible light detection accuracy improves, but production costs increase
Solution Approach 1:
The pixel array is segmented into first pixel regions without the second optical layer (receiving only visible light through the first optical layer) and second pixel regions with the second optical layer. This segmentation eliminates the need for expensive infrared blocking filters in the visible light detection regions while preserving near-infrared detection capability in dedicated regions.
Solution Approach 2:
The optical configuration is optimized locally for each pixel region's detection purpose. First pixel regions have the simpler first optical layer configuration suitable for visible light detection, while second pixel regions have the additional second optical layer for near-infrared detection, avoiding unnecessary filter costs in each local region.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution enables high detection accuracy for visible light while reducing near-infrared light noise, achieving minimum production costs and improved detection precision.
Implementation Method 1
a first optical layer that transmits visible light and at least a part of near-infrared light... the first optical layer includes a compound (A) having at least one absorption maximum at the wavelength of from 600 to 900 nm
Implementation Method 2
a second optical layer that absorbs at least a part of the near-infrared light... the second optical layer includes a compound (B) having at least one absorption maximum at the wavelength of from 755 to 1050 nm
Implementation Method 3
light-receiving elements (visible-light detection sensor) that detect visible light for every pixel, generate an electric signal corresponding to visible light incident from the outside
Data Source
AI summary
The present invention intends to provide a solid-state imaging device having minimum production costs and high detection accuracy. A solid-state imaging device includes a first optical layer that transmits visible light and at least a part of near-infrared light, a second optical layer that absorbs at least a part of the near-infrared light and a pixel array that includes a first light-receiving element that detects the visible light transmitted through the first optical layer and the second optical layer and a second light-receiving element that detects the near-infrared light transmitted through the first optical layer, in which the second optical layer has an opening at a part corresponding to the second light-receiving element, the first optical layer includes a compound (A) having at least one absorption maximum at the wavelength of from 750 to 900 nm,the second optical layer includes a compound (B) having at least one absorption maximum at the wavelength of from 755 to 1050 nm, an absorption maximum wavelength on a longest wavelength side of the compound (B) is larger than an absorption maximum wavelength on the longest wavelength side of the compound (A), and a difference between both is from 5 to 150 nm.