Leak Detection for Solid State Devices via Sub-Threshold Testing
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Solution Overview
Problem
Solid state devices used in applications like circuit breakers and e-Fuses cannot be tested to ensure they will correctly transition from an on state to an off state in response to abnormal conditions, leading to potential catastrophic failures.
Innovation Solution
A leak detection component that monitors the health of solid state devices by measuring leakage current through applying a test voltage below the threshold voltage, allowing for early detection of threshold voltage drift and potential failures.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Duration of action of stationary object
If solid state devices remain in the same state for extended periods without testing, then device operational duration is improved, but reliability deteriorates due to inability to detect threshold voltage drift and leakage current
Solution Approach 1:
The patent applies preliminary action by performing leakage current measurements and threshold voltage drift detections before catastrophic failures occur. The system continuously monitors the solid state device during operation, applying test signals and measuring electrical characteristics to detect early signs of degradation, thereby preventing future failures rather than responding after damage has occurred.
2Reliability
If continuous monitoring is implemented to detect leakage current and threshold voltage drift, then reliability is improved, but device complexity increases
Solution Approach 1:
The patent merges the monitoring functions with the existing operational circuitry of the solid state device. The same electrical paths and components used for normal operation are utilized for leakage current measurements, minimizing additional hardware. The control logic integrates threshold voltage detection and leakage current measurement sequences into the existing device control structure, reducing overall system complexity while maintaining continuous monitoring capability.
3Measurement precision
If test voltages are applied to detect leakage current, then measurement precision is improved, but energy consumption increases
Solution Approach 1:
The patent implements periodic action by applying test voltages and measuring leakage currents at scheduled intervals rather than continuously. The system performs measurement sequences at defined moments during operation, allowing the device to alternate between normal operation and diagnostic measurement modes. This periodic approach maintains measurement precision while significantly reducing average energy consumption compared to continuous testing.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables in-situ monitoring of solid state devices during operation, providing early warning of imminent or future failures and preventing catastrophic events by detecting leakage currents and threshold voltage drifts.
Implementation Method 1
measuring leakage current through applying a test voltage below the threshold voltage
Data Source
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AI summary
An apparatus comprises a solid state device and a switch in series with the solid state device. The apparatus comprises a leak detection component connected to the solid state device. The apparatus comprises a gate driver configured to drive a gate of the solid state device. The gate driver comprises test circuitry configured to apply a test voltage to the gate of the solid state device. The test voltage is less than a threshold voltage of the solid state device. The leak detection component is configured to detect a leakage of the solid state device.