In-situ Solid-State Light Source Health Characterization
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Solution Overview
Problem
Direct monitoring of solid-state light sources is challenging as it can disrupt the output path or cause unwanted feedback, and using a 'canary' device as a proxy may fail before or after other devices, preventing effective in-situ characterization.
Innovation Solution
A system that monitors voltage and current of solid-state light sources using nonlinear, non-parametric regression analysis and multivariate state estimation techniques, allowing for health characterization and prediction of impending failures, with the option to take remedial action and determine the cause of failures.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If direct monitoring of solid-state light source output is performed, then health characterization is achieved, but output path disruption or unwanted feedback occurs that impacts device output
Solution Approach 1:
The patent uses voltage and current as intermediary parameters to indirectly characterize the health of the solid-state light source. Instead of directly monitoring the optical output which would cause disruption or feedback, the system monitors electrical parameters (voltage and current) that correlate with device health through regression analysis and multivariate state estimation techniques
Solution Approach 2:
The patent replaces direct optical monitoring with electrical parameter monitoring. By substituting the mechanical/optical measurement approach with an electrical measurement approach, the system achieves health characterization without the harmful side effects of output path disruption or feedback
2Adaptability or versatility
If a canary solid-state device is used as a proxy for monitoring, then system-wide health monitoring is enabled, but the proxy device may fail before or after other devices preventing accurate characterization
Solution Approach 1:
The patent enables each solid-state light source to monitor its own health through direct measurement of its voltage and current characteristics. Each device performs self-characterization through regression analysis of its own electrical parameters, eliminating the need for external proxy devices and providing accurate, device-specific health information
3Measurement precision
If voltage and current monitoring with regression analysis is performed, then accurate in-situ health characterization is achieved, but system complexity increases
Solution Approach 1:
The patent employs universal regression analysis and multivariate state estimation techniques that can characterize the health of different types of solid-state light sources (VCSELs, LEDs, DFB lasers) using the same voltage and current monitoring approach. This universal method reduces the need for device-specific monitoring systems while maintaining high measurement precision
Data Source
AI summary
Some embodiments of the present invention provide a system for in-situ characterization of a solid-state light. First, a voltage and a current of the solid-state light source are monitored. Then, the health of the solid-state light source is characterized based on an analysis of the monitored voltage and current.