Solid-State Memory ECC Encoder Reduces Write Cycles
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Solution Overview
Problem
Solid-state memory devices, such as flash memory, experience slower write throughput compared to read throughput due to repeated write/read-verify operations, which can degrade storage capacity over time.
Innovation Solution
Implementing a powerful error correction code (ECC) encoder/decoder, such as Bose-Chaudhuri-Hocquenghem (BCH) coding, to correct errors within the data, allowing for reduced write/read-verify iterations and potentially eliminating the need for read-verify operations, thereby enhancing write throughput.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If repeated write/read-verify operations are performed to ensure data reliability, then data reliability is improved, but write throughput deteriorates
Solution Approach 1:
The patent applies preliminary action by performing error correction coding during the write operation itself, rather than waiting for read-verify operations to detect and correct errors. The ECC encoder processes data before it is written to memory, and the ECC decoder is ready to immediately correct errors upon reading, eliminating the need for multiple iterative write/read-verify cycles and thereby improving write throughput while maintaining data reliability
2Reliability
If multiple write operations are performed to correct errors, then data reliability is improved, but storage capacity degradation accelerates
Solution Approach 1:
The patent applies preliminary action by pre-calculating and storing ECC information alongside the data during the initial write operation. This allows errors to be corrected during subsequent read operations without requiring additional write operations, thereby reducing the number of programming cycles and slowing down storage capacity degradation while maintaining data reliability
3Reliability
If read-verify operations are performed to detect errors, then data reliability is improved, but write throughput deteriorates
Solution Approach 1:
The patent applies feedback by implementing a systematic error correction mechanism where the ECC decoder continuously monitors read operations and provides corrective feedback when errors are detected. The syndrome decoding process analyzes error patterns and generates correction information that is applied to the retrieved data, ensuring data reliability while minimizing the need for repeated write operations and thereby preserving write throughput
Data Source
AI summary
In a particular embodiment, a storage device is disclosed that includes a solid-state storage media. The storage device further includes a read/write circuit including an error correction coding (ECC) encoder/decoder adapted to write data and associated ECC information to the solid-state storage media without performing a read-verify operation.