Solid-State Storage Testing via Temperature-Accelerated Read Scan Compensation
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Solution Overview
Problem
Conventional temperature-accelerated solid-state NAND storage system testing methods produce inaccurate results due to data retention degradation during read scan operations, leading to inefficiencies in testing and configuration of solid-state storage systems.
Innovation Solution
A method involving writing data to multiple pages in a storage system, subjecting it to elevated temperatures for specific time periods, and then reading the data at reduced temperatures to generate test data, which adjusts 'bake' times based on read scan operations to minimize data retention degradation and ensure accurate testing results.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of operation
If data is read from solid-state storage systems during lifetime operation, then data can be accessed and used, but errors are introduced into the stored data
Solution Approach 1:
The patent converts the harmful effect of read operations (which introduce errors) into a beneficial testing mechanism. By intentionally performing read operations during accelerated life testing, the method captures the actual error introduction behavior that occurs during normal use, allowing the testing results to reflect real-world reliability rather than idealized conditions.
2Productivity
If testing is performed at elevated temperatures to reduce testing duration, then testing speed increases, but testing accuracy decreases due to data retention degradation during read operations
Solution Approach 1:
The patent implements feedback by using the error rates measured during accelerated life testing at elevated temperatures to adjust and refine the error rate models. The testing process continuously monitors actual errors introduced during read operations and uses this information to improve the accuracy of reliability predictions, ensuring that accelerated testing results accurately reflect normal operating conditions.
Solution Approach 2:
The patent changes the temperature parameter during testing to accelerate the testing process. By conducting tests at elevated temperatures (e.g., 85°C or higher) and then using Arrhenius-based models to extrapolate results to normal operating temperatures, the method achieves both fast testing and accurate results by properly accounting for temperature-dependent error rates.
3Loss of time
If conventional temperature-accelerated testing methods are used, then testing duration is reduced, but testing results become inaccurate due to unaccounted data retention degradation
Solution Approach 1:
The patent performs preliminary characterization of read operation effects on data retention at elevated temperatures before conducting the main accelerated life testing. This preliminary action establishes baseline error rates and degradation patterns that are then used to interpret and correct the main testing results, ensuring accuracy while maintaining the time-saving benefits of accelerated testing.
Data Source
AI summary
A temperature-accelerated solid-state storage testing method includes writing data to a storage system and subjecting the storage system to a first temperature range for a first time period that is equivalent to operation at a lower/second temperature for a greater/second time period. Subsequently, the data from the storage system is read within a third time period at a third temperature range to generate first test data. The storage system is then subjected to the first temperature range for a fourth time period that was reduced relative to the first time period based on the reading of the data to generate the first test data causing the operation of storage system to be equivalent to operating at the second temperature range for a fifth time period. Subsequently the data from the storage system is read within the third time period at the third temperature range to generate second test data.