Solid State Switch Power Emulator Circuit for IGBT Testing
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Solution Overview
Problem
High voltage silicon carbide insulated-gate bipolar transistors (IGBTs) require safe and cost-effective testing for continuous power applications, which is challenging due to the high power levels involved, necessitating a solution for accurate and efficient evaluation without the risks and expenses associated with high voltage components.
Innovation Solution
A solid state switch power emulator circuit is designed with a high voltage section and a low voltage section connected in parallel to a device under test (DUT), using high voltage and low voltage power supplies, capacitors, switches, and loads, along with a high voltage diode, to emulate electrical power switching, allowing for safe and efficient testing by mimicking the conditions a DUT would experience in a typical high power circuit.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If high voltage power supplies and high energy components are used to test high voltage IGBTs, then accurate testing of continuous power operation is achieved, but safety risks and costs increase significantly
Solution Approach 1:
The circuit is divided into two independent sections: a high voltage section (HVPS, HVC, HVS, HVL) for applying voltage stress and a low voltage section (LVPS, LVC, LVS, LVL) for providing current. This segmentation allows each section to operate at optimized voltage levels, reducing the need for dangerous high power components while maintaining testing accuracy.
Solution Approach 2:
The high voltage diode (HVD) acts as an intermediary component that enables current flow from the low voltage section through the device under test during specific switching phases. This mediator allows the low voltage section to contribute to the testing without directly exposing operators to high voltage dangers.
2Measurement precision
If high voltage power supplies and high energy components are used to test high voltage IGBTs, then accurate testing of continuous power operation is achieved, but costs become expensive
Solution Approach 1:
By segmenting the power supply into high voltage and low voltage sections with independent power supplies, the circuit avoids the need for a single expensive high power supply that would be required to deliver both high voltage and high current simultaneously. Each power supply can be optimized and sized independently, reducing overall cost.
Solution Approach 2:
The circuit uses lower energy components in the low voltage section that are less expensive and can be more easily replaced if needed, rather than requiring expensive high energy components throughout the entire circuit.
3Reliability
If high power levels are used for testing, then continuous power operation verification is achieved, but the testing environment becomes dangerous
Solution Approach 1:
The testing circuit is segmented into high voltage and low voltage sections that operate independently but work together to verify continuous power operation. The high voltage section handles voltage stress while the low voltage section provides current, allowing reliability verification without requiring the entire system to operate at dangerous high power levels simultaneously.
Solution Approach 2:
The circuit changes operating parameters by using different voltage levels in different sections. The high voltage section operates at high voltage but low current, while the low voltage section operates at low voltage but higher current, maintaining the necessary power levels for testing while reducing the dangerous high power environment.
4Device complexity
If a single high power supply is used, then the circuit is simpler, but the power supply becomes large and expensive
Solution Approach 1:
The power supply system is segmented into two separate power supplies: HVPS for high voltage and LVPS for low voltage. This segmentation allows each power supply to be smaller and less expensive than a single high power supply would be, while together they provide the necessary power for testing.
Data Source
AI summary
A solid state switch power emulator circuit, the circuit including a high voltage section including a high voltage power supply (HVPS); a high voltage capacitor (HVC) electronically connected to the HVPS in parallel; a high voltage switch (HVS) electronically connected to the HVC and the HVPS in series; and a high voltage load (HVL) electronically connected to the HVS in series; a low voltage section including a low voltage power supply (LVPS); a low voltage capacitor (LVC) electronically connected to the LVPS in parallel; a low voltage switch (LVS) electronically connected to the LVPS and the LVC in series; a low voltage load (LVL) electronically connected to the LVS in series; and a high voltage diode (HVD) electronically connected to the LVL in series, wherein voltage levels associated with the low voltage section are less than voltage levels associated with the high voltage section.