Solvent Annealing Block Copolymers for Nanoscale Pattern Perfection

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Solution Overview

Problem

Traditional nanofabrication methods, such as photolithography and electron beam lithography, are limited in forming nanoscale structures with high precision and complexity, especially for three-dimensional structures and critical dimensions below certain sizes.

Innovation Solution

The use of solvent annealing to direct the self-assembly of block copolymers on chemical patterns, allowing for high degrees of pattern perfection, improved dimensional control, and resolution enhancement by factors of two to four or greater, through the formation of microphase-separated domains that are registered and oriented perpendicular to the substrate.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If traditional photolithography and electron beam lithography are used, then nanoscale structures can be formed, but manufacturing precision and resolution are limited as critical dimensions decrease

Engineering Contradiction:
Improvenanoscale structure precisionVSAvoidcritical dimension control
Core Design Contradiction:
Manufacturing precisionVSMeasurement precision

Solution Approach 1:

The patent segments the patterning process into two distinct stages: first forming a chemical pattern on the substrate, then using block copolymer self-assembly to create the final nanoscale structure. This segmentation allows each stage to optimize for its specific function, with the chemical pattern providing guidance and the block copolymer providing the final high-resolution features.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent introduces a chemical pattern as an intermediary element that mediates between the substrate and the block copolymer. This chemical pattern acts as a template that directs the self-assembly of block copolymers, enabling precise control over the position and orientation of the final nanoscale features without requiring direct lithographic patterning at that scale.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Device complexity

If photolithography and electron beam lithography are used, then patterns can be formed, but fabrication of three-dimensional structures and complex features is limited

Engineering Contradiction:
Improvestructure complexityVSAvoidfabrication ease
Core Design Contradiction:
Device complexityVSEase of manufacture

Solution Approach 1:

The patent employs self-service by utilizing the inherent self-assembly properties of block copolymers. The block copolymers automatically organize into ordered microphase-separated structures when exposed to the chemical pattern, eliminating the need for complex external guidance or multiple lithographic steps to create three-dimensional and complex features.

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The patent changes the physical and chemical parameters of the system by introducing solvents that selectively interact with different block copolymer blocks. This solvent annealing process alters the conformation and assembly behavior of the block copolymers, enabling them to form complex three-dimensional structures that would not be achievable through traditional lithography alone.

Inventive Principle:
Principle #35Parameter changes

3Manufacturing precision

If block copolymer self-assembly is used, then resolution enhancement by factors of two to four or greater is achieved, but process complexity increases

Engineering Contradiction:
Improveresolution enhancementVSAvoidprocess complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The patent performs preliminary action by first creating the chemical pattern on the substrate before introducing the block copolymers. This pre-formed chemical pattern serves as a template that guides the subsequent self-assembly process, ensuring that the block copolymers assemble into the desired high-resolution features at the correct positions and orientations.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent utilizes phase transitions of block copolymers during solvent annealing, where the polymer blocks transition between different conformational states and assembly configurations. By controlling the solvent environment and annealing conditions, the system transitions from a disordered state to an ordered microphase-separated structure, achieving high resolution through this controlled phase transition.

Inventive Principle:
Principle #36Phase transitions

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enables the creation of nanoscale structures with enhanced precision and complexity, achieving high degrees of pattern perfection and resolution enhancement, suitable for applications in electronics and integrated circuit fabrication.

Implementation Method 1

inducing the formation of microphase-separated domains in the block copolymer material by solvent annealing

Methodology Applied
Scientific EffectSolvent annealing: Annealing

Implementation Method 2

the formation of microphase-separated domains that are registered and oriented perpendicular to the substrate

Methodology Applied
Scientific EffectMicrophase separation:

Implementation Method 3

The solvent can be evaporated after the assembly of the block copolymer film

Methodology Applied
Scientific EffectEvaporation: Evaporation

Data Source

PatentUS9299381B2Solvent annealing block copolymers on patterned substrates
Publication Date: 2016.03.29 WISCONSIN ALUMNI RES FOUND
  • US9299381B2 patent drawing
  • US9299381B2 patent drawing
  • US9299381B2 patent drawing

AI summary

Provided herein are block copolymer thin film structures and methods of fabrication. Aspects described herein include methods of directed self-assembly of block copolymers on patterns using solvent annealing, and the resulting thin films, structures, media or other compositions. According to various embodiments, solvent annealing is used direct the assembly of block copolymers on chemical patterns to achieve high degrees of pattern perfection, placement of features at the precision of the lithographic tool used to make the chemical pattern, improved dimensional control of features, improved line edge and line width roughness, and resolution enhancement by factors of two to four or greater.