SoP Module Testing via Dual-Side PCB Conductors

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Solution Overview

Problem

Conventional system-on-package (SoP) technologies do not allow for testing of integrated circuits (ICs) after they have been attached to a system board, limiting the ability to verify or retest the functionality of SoCs post-attachment.

Innovation Solution

A system-on-package module with a printed circuit board (PCB) that has electrical paths connecting ICs on opposite sides, enabling testing of one IC before attaching a second IC, using conductors that serve both as test and attachment points.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If ICs are attached to the system board in conventional SoP, then the system can be assembled, but the IC cannot be tested after attachment

Engineering Contradiction:
Improvetesting capabilityVSAvoidsystem board structure
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The system board is divided into two sides: a first side for attaching ICs and a second side for testing. Conductive paths are formed only on the second side, separating the attachment function from the testing function. This allows ICs to be attached on the first side while enabling testing on the second side without complicating the overall structure.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Conductive paths serve as intermediaries that transfer test signals from the second side through the substrate to the IC on the first side. These paths enable electrical connection and signal transmission without requiring direct access to the IC after attachment, solving the testing problem while maintaining a clean separation of functions.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Ease of manufacture

If conductors are used for attaching ICs, then the IC can be electrically connected, but testing before attachment becomes difficult

Engineering Contradiction:
Improveassembly processVSAvoidtesting capability
Core Design Contradiction:
Ease of manufactureVSReliability

Solution Approach 1:

Conductive paths are pre-formed on the second side of the substrate before IC attachment. This allows test signals to be prepared in advance and transmitted to the IC after attachment, enabling both ease of assembly and reliable testing without requiring complex reconfiguration.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The conductors on the second side serve dual purposes: they provide electrical connection for attaching ICs and simultaneously serve as test signal transmission paths. This multi-functionality eliminates the need for separate testing infrastructure, simplifying manufacturing while ensuring testing capability.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables the testing of ICs before final attachment, ensuring functionality and allowing for potential retesting, thereby improving the reliability and performance of SoP modules in mobile computing devices.

Implementation Method 1

the PCB includes electrical paths along which the first IC and the second IC are electrically connected

Methodology Applied
Scientific EffectElectrical conduction: Conduction (electrical)

Data Source

PatentUS9839127B2System of package (SoP) module and mobile computing device having the SoP
Publication Date: 2017.12.05 SAMSUNG ELECTRONICS CO LTD
  • US9839127B2 patent drawing
  • US9839127B2 patent drawing
  • US9839127B2 patent drawing

AI summary

A system on package SoP module includes a printed circuit board (PCB) having a first side and an opposing second side, a first IC attached to the first side, a second IC attached to the second side. The PCB also provides electrical paths for connecting the first IC and the second IC. Conductors by which the second IC is attached to the PCB also allow for electrical testing of the first IC when the SoP is in a system level state.