Spacer Lithography Variable Pitch Division

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Solution Overview

Problem

Spacer-based pitch division techniques in lithography are limited to achieving only constant line and space widths, failing to realize variable line and space widths, which is a significant limitation for patterning layers requiring multiple widths.

Innovation Solution

A spacer-based lithography process that involves depositing a spacer material with a specific thickness onto a circuit pattern, allowing it to fill tight space geometries and merge adjacent spacers, enabling the achievement of variable line and space widths by transferring the spacer pattern into a hardmask or substrate, and filling the resulting structures with conductive or insulative materials.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If spacer-based pitch division techniques are used, then sub-resolution features can be achieved, but only constant line and space widths can be obtained

Engineering Contradiction:
Improvefeature sizeVSAvoidline width variation
Core Design Contradiction:
Manufacturing precisionVSAdaptability or versatility

Solution Approach 1:

The patent applies local quality by selectively filling only certain spaces between adjacent spacers with spacer material, while leaving other spaces unfilled. This selective filling approach enables different regions of the pattern to have different line and space widths, achieving variable pitch structures. The key is that the filling process is localized to specific spaces based on design requirements, allowing constant spacer thickness to produce variable final dimensions.

Inventive Principle:
Principle #3Local quality

2Adaptability or versatility

If multiple spacer depositions are used to achieve variable line widths, then manufacturing complexity increases

Engineering Contradiction:
Improveline width variationVSAvoidprocess steps
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The patent merges the functions of multiple spacer depositions into a single spacer deposition process. By selectively filling spaces between adjacent spacers with additional spacer material, the method achieves variable line widths that would otherwise require multiple separate spacer formation steps. This consolidation reduces process complexity while maintaining the ability to produce variable pitch structures.

Inventive Principle:
Principle #5Merging (Combining)

3Adaptability or versatility

If spacer material is deposited to fill tight spaces, then variable pitch is achieved, but pitch division ratio is limited

Engineering Contradiction:
Improvepitch variationVSAvoidpitch division ratio
Core Design Contradiction:
Adaptability or versatilityVSManufacturing precision

Solution Approach 1:

The patent applies dynamics by making the spacer filling process adjustable and flexible. The selective filling approach allows the pitch division ratio to be dynamically controlled based on which spaces are filled and how much spacer material is deposited. This enables continuous adjustment of the final pitch dimensions rather than being constrained to fixed division ratios, achieving both variable pitch and precise control.

Inventive Principle:
Principle #15Dynamics

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This process allows for the realization of integrated circuits with variable line and space widths, achieving half the minimum pitch of the original backbone pattern, and further reducing pitch with subsequent spacer formation and pattern transfer processes, enabling features below the resolution limit of the exposure system.

Implementation Method 1

depositing a conformal layer of spacer material on the pattern and substrate

Methodology Applied
Scientific EffectPhysical Vapour Deposition: Physical Vapour Deposition

Data Source

PatentUS8860184B2Spacer assisted pitch division lithography
Publication Date: 2014.10.14 INTEL CORP
  • US8860184B2 patent drawing
  • US8860184B2 patent drawing
  • US8860184B2 patent drawing

AI summary

Spacer-based pitch division lithography techniques are disclosed that realize pitches with both variable line widths and variable space widths, using a single spacer deposition. The resulting feature pitches can be at or below the resolution limit of the exposure system being used, but they need not be, and may be further reduced (e.g., halved) as many times as desired with subsequent spacer formation and pattern transfer processes as described herein. Such spacer-based pitch division techniques can be used, for instance, to define narrow conductive runs, metal gates and other such small features at a pitch smaller than the original backbone pattern.