Self-Calibrating SPAD TDC Circuit for DNL-Limited Depth Sensing

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Solution Overview

Problem

The effective resolution of time-to-digital converters (TDCs) in single-photon avalanche diode (SPAD) based depth sensing is limited by differential nonlinearity (DNL) and integral nonlinearity (INL), which affect the accuracy of time-of-flight measurements.

Innovation Solution

A self-calibration TDC circuit is implemented, utilizing a global delay-locked loop (DLL) with a circular multiplexer that routes signals from each output terminal to latch cells in a column TDC array, and a digital control logic circuit for circular multiplexing between column latch and global DLL output, effectively averaging out phase variations to improve nonlinearity.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If a conventional TDC circuit is used for time-of-flight measurement, then the basic time measurement function is achieved, but the measurement precision is limited by differential nonlinearity and integral nonlinearity

Engineering Contradiction:
Improvetime measurement accuracyVSAvoiddifferential nonlinearity and integral nonlinearity
Core Design Contradiction:
Measurement precisionVSManufacturing precision

Solution Approach 1:

The patent applies preliminary action by performing self-calibration before actual time-of-flight measurements. The TDC circuit executes calibration sequences that pre-characterize its own timing behavior, storing calibration data that compensates for DNL and INL errors during subsequent measurements. This preliminary calibration action resolves the contradiction by preparing the system to achieve high measurement precision despite manufacturing imperfections.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent implements feedback through calibration sequences that measure the TDC's actual timing performance and use this information to generate correction factors. These correction factors are fed back into the measurement process to compensate for nonlinearity errors. The feedback mechanism enables the system to achieve high measurement precision by continuously correcting for manufacturing-induced DNL and INL variations.

Inventive Principle:
Principle #23Feedback

2Measurement precision

If calibration sequences are implemented to reduce nonlinearity, then measurement accuracy is improved, but device complexity increases

Engineering Contradiction:
Improvetime measurement accuracyVSAvoidcircuit complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent applies self-service by implementing self-calibration functionality within the TDC circuit itself. The calibration sequences are executed autonomously by the TDC using its own internal resources (phase shifters, delay elements, and control logic). This self-calibration approach improves measurement accuracy without requiring external calibration equipment or significantly increasing device complexity, as the system calibrates itself using existing circuit components.

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The patent implements multi-functionality by designing the TDC circuit to perform both normal time-of-flight measurement and self-calibration functions using the same hardware resources. The phase shifters, delay elements, and control logic are utilized for both measurement and calibration purposes. This universal design improves measurement accuracy through calibration while minimizing device complexity by avoiding dedicated calibration hardware.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Data Source

PatentUS11199444B2Time-to-digital converter circuit and method for single-photon avalanche diode based depth sensing
Publication Date: 2021.12.14 TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
  • US11199444B2 patent drawing
  • US11199444B2 patent drawing
  • US11199444B2 patent drawing

AI summary

A self-calibration time-to-digital converter (TDC) integrated circuit for single-photon avalanche diode (SPAD) based depth sensing is disclosed. The circuit includes a SPAD matrix with a plurality of SPAD pixels arranged in m rows and n columns, the SPAD pixels in each column of SPAD pixels are connected by a column bus; a global DLL unit with n buffers and n clock signals; and an image signal processing unit for receiving image signals from the column TDC array. The circuit can also include a row control unit configured to enable one SPAD pixel in each row for a transmitting signal; a circular n-way multiplexer for circularly multiplexing n clock signals in the global DLL unit; a column TDC array with n TDCs, each TDC further comprises a counter and a latch, the latch of each TDC is connected to the circular n-way multiplexer for circular multiplexing.