SPAD Array Temperature Modeling for Breakdown Voltage Calibration

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

The temperature changes within electronic devices due to heat generation cause fluctuations in the avalanche breakdown voltage of single-photon avalanche diode arrays, leading to instability in performance parameters like dark count rate (DCR) and photon detection efficiency (PDE), affecting the accuracy of devices like LiDAR.

Innovation Solution

A parameter calibration method that involves obtaining a temperature model and drift curve to adjust the input voltage of the single-photon avalanche diode array in real-time, ensuring accurate and stable operation by calibrating the avalanche breakdown voltage.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Device complexity

If the avalanche breakdown voltage is calibrated at a fixed temperature, then the calibration process is simple, but the receiving parameters become unstable when temperature changes occur

Engineering Contradiction:
Improvecalibration process complexityVSAvoidreceiving parameter stability
Core Design Contradiction:
Device complexityVSReliability

Solution Approach 1:

The patent implements dynamic calibration by establishing a temperature model that continuously tracks temperature changes across different positions of the SPAD array, and dynamically adjusts the avalanche breakdown voltage calibration values according to the current temperature state, transforming the static calibration approach into a dynamic adaptive system

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The patent employs feedback mechanisms by measuring the actual temperature distribution of the SPAD array, comparing it with the temperature model, and using this information to adjust the calibration values of the avalanche breakdown voltage, thereby closing the control loop to maintain parameter stability

Inventive Principle:
Principle #23Feedback

2Reliability

If real-time temperature compensation is implemented, then the receiving parameter stability is improved, but the device complexity increases

Engineering Contradiction:
Improvereceiving parameter stabilityVSAvoidcalibration system complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent enables the SPAD array to perform self-calibration by using its own temperature characteristics data to build the temperature model and automatically adjust its calibration values, reducing the need for external complex calibration equipment and manual intervention

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The patent performs preliminary actions by pre-establishing the temperature model through initial temperature measurements at multiple positions, which prepares the foundation for rapid real-time compensation without requiring complex calculations during operation

Inventive Principle:
Principle #10Preliminary action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The method ensures the accuracy and stability of receiving parameters by dynamically adjusting the avalanche breakdown voltage based on temperature changes, thereby maintaining consistent performance.

Implementation Method 1

single-photon avalanche diode array... avalanche breakdown voltage of SPAD arrays... adjusting the input voltage of the single-photon avalanche diode array according to the calibration value of the avalanche breakdown voltage

Methodology Applied
Scientific EffectAvalanche breakdown: Avalanche Breakdown

Data Source

PatentUS20250391053A1Parameter calibration method, electronic device and computer readable storage medium
Publication Date: 2025.12.25 SUTENG INNOVATION TECHNOLOGY CO LTD
  • US20250391053A1 patent drawing
  • US20250391053A1 patent drawing
  • US20250391053A1 patent drawing

AI summary

A method, an electronic device, and a computer-readable storage medium are provided. The method includes: obtaining a calibration value of avalanche breakdown voltage of a single-photon avalanche diode array, calibration values of parameters of the single-photon avalanche diode array, and a temperature drift curve of the single-photon avalanche diode array; obtaining temperature of at least two positions of the single-photon avalanche diode array in a circumferential direction according to the calibration value; obtaining a temperature model of the single-photon avalanche diode array according to the temperature of at least two positions; and determining a calibration value of avalanche breakdown voltage of the single-photon avalanche diode array according to the temperature model, the temperature drift curve, and the calibration value of the parameter of the single-photon avalanche diode array and adjusting the input voltage of the single-photon avalanche diode array accordingly.