Data Storage Device Spare-Region Management for Defect Remapping
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Solution Overview
Problem
Data storage devices face inefficiency and premature failure due to uneven distribution of spare storage regions across physically or logically separated memory areas, leading to incomplete lifespan determination and performance issues when individual memory areas reach specific bad block ratios.
Innovation Solution
A data storage device and method that manages spare storage regions by classifying memory areas into multiple storage areas, monitoring defect information, and remapping logical addresses based on bad block counts using a host interface layer and flash translation layers to maintain a predetermined ratio or size across each area.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If the data storage device has a plurality of physically or logically separated memory areas, then the reliability is improved by providing spare storage regions in each area, but the device complexity increases due to independent calculation and management of spare ratios for each memory area
Solution Approach 1:
The patent merges the management of spare storage regions across multiple memory areas by introducing a global spare region management mechanism. Instead of independently calculating and managing spare ratios for each memory area, the system consolidates this function at the device level, allowing flexible allocation of spare regions across all memory areas based on overall device needs rather than individual area constraints.
2Reliability
If the spare storage region ratio is independently calculated for each memory area, then the reliability is improved by maintaining spare regions in each area, but the productivity decreases when any single memory area falls below the predetermined ratio, causing premature device shutdown
Solution Approach 1:
The patent introduces dynamic spare region allocation that adapts to the actual usage status of each memory area. The system continuously monitors the number of mapped logical addresses in each memory area and dynamically adjusts the allocation to maintain an optimal overall spare ratio. This dynamic approach allows the system to continue operating as long as the global spare ratio is maintained, rather than shutting down when a single memory area falls below its threshold.
Solution Approach 2:
The patent changes the parameter for spare region management from a static, independent ratio threshold for each memory area to a dynamic global spare ratio. The system monitors the actual number of mapped logical addresses and adjusts the spare region allocation accordingly, allowing flexible adaptation to varying usage patterns and extending device operation beyond the limitations of fixed per-area thresholds.
3Ease of operation
If the number of logical addresses is fixed for each memory area, then the ease of operation is improved by simplifying address mapping, but the adaptability decreases when defect information changes, requiring rigid reallocation
Solution Approach 1:
The patent implements dynamic address remapping that automatically adjusts the number of logical addresses mapped to each memory area based on defect information. When defects are detected, the system dynamically reallocates logical addresses across memory areas to maintain optimal spare ratios, eliminating the need for rigid fixed allocations and improving both adaptability and ease of operation through automated management.
Data Source
AI summary
Embodiments of the present disclosure relate to a data storage device that manages a spare region in each memory area to be maintained at a predetermined ratio or size or higher based on defect information of each memory area, and an operation method of the data storage device. According to the embodiments of the present disclosure, there may be provided an operation method of a data storage device, the method comprising classifying a plurality of memory areas provided in a memory device into a plurality of storage areas, managing the plurality of storage areas by mapping a logical address externally received to each of the plurality of storage areas, monitoring defect information generated in a memory area corresponding to each of the plurality of storage areas, and remapping the logical addresses for each of the plurality of storage areas based on the defect information.