Sparse Sampling Microscopy with Mathematical Registration
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Solution Overview
Problem
Current scanning microscopy techniques are limited by slow imaging processes and radiation damage when attempting to image large specimen areas or radiation-sensitive samples, leading to impractical throughput and signal-to-noise ratio issues.
Innovation Solution
A method involving sparse sampling sessions across a specimen, followed by mathematical registration correction and integrative reconstruction to assemble a full image, reducing cumulative scan time and radiation dose while allowing for multi-pass exposure to mitigate damage.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Area of stationary object
If conventional scanning microscopy is used to image large specimen areas, then complete coverage is achieved, but imaging time becomes excessively long and radiation damage increases
Solution Approach 1:
The patent divides the imaging process into multiple passes, where each pass scans only a subset of regions of interest (ROIs) within the specimen area. Instead of scanning the entire area in one continuous process, the large area is segmented into smaller regions that can be imaged separately and then computationally assembled, dramatically reducing the time required for each individual scan while still achieving complete area coverage across multiple passes.
Solution Approach 2:
The patent performs preliminary identification of regions of interest (ROIs) before the main imaging process. By pre-segmenting the specimen area into relevant regions that require detailed imaging, the system can focus scanning resources only on these identified areas during subsequent passes, avoiding wasted time scanning non-critical regions and thereby reducing overall imaging time while maintaining complete area coverage.
2Area of stationary object
If conventional scanning microscopy is used to image large specimen areas, then complete coverage is achieved, but radiation damage to the specimen increases
Solution Approach 1:
The patent segments the imaging process into multiple passes, each scanning only specific regions of interest rather than continuously scanning the entire specimen area. This segmentation reduces the cumulative radiation exposure to any single region, as each area is scanned only when necessary to complete the composite image, thereby minimizing total radiation damage while still achieving complete area coverage.
Solution Approach 2:
The patent applies partial scanning by focusing radiation only on identified regions of interest during each pass, rather than scanning the entire specimen area uniformly. This partial action approach ensures that radiation is applied only where necessary to build the complete image, reducing overall radiation exposure and damage to the specimen while maintaining complete area coverage through computational assembly of the scanned regions.
3Productivity
If scanning speed is increased to reduce imaging time, then productivity improves, but signal-to-noise ratio deteriorates
Solution Approach 1:
The patent segments the specimen area into multiple regions of interest and divides the imaging task across multiple passes. This allows the system to maintain higher scanning speeds (improving productivity) while still accumulating sufficient signal data in each region by visiting it repeatedly across different passes, thereby preserving signal-to-noise ratio despite increased scanning velocity.
Solution Approach 2:
The patent achieves continuity of useful action by performing multiple passes over the same regions of interest. Even though the beam moves quickly during each pass (maintaining high productivity), the repeated scanning of the same regions across multiple passes allows signal accumulation, ensuring that the signal-to-noise ratio is maintained despite the high scanning speed used during individual passes.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables faster imaging of larger areas with improved signal-to-noise ratio and reduced radiation damage, facilitating the imaging of radiation-sensitive specimens without compromising resolution.
Implementation Method 1
Providing a beam of radiation that is directed from a source through an illuminator so as to irradiate the specimen; Providing a detector for detecting a flux of radiation emanating from the specimen in response to said irradiation
Data Source
Figure 1
Figure 2A~2B
Figure 3A~3B
AI summary
A method of accumulating an image of a specimen using a scanning-type microscope, comprising the following steps: - Providing a beam of radiation that is directed from a source through an illuminator so as to irradiate the specimen; - Providing a detector for detecting a flux of radiation emanating from the specimen in response to said irradiation; - Causing said beam to undergo scanning motion relative to a surface of the specimen, and recording an output of the detector as a function of scan position, which method additionally comprises the following steps: - In a first sampling session S1, gathering detector data from a first collection P1 of sampling points distributed sparsely across the specimen; - Repeating this procedure so as to accumulate a set {Pn} of such collections, gathered during an associated set {Sn} of sampling sessions, each set with a cardinality N > 1; - Assembling an image of the specimen by using the set {Pn} as input to an integrative mathematical reconstruction procedure, wherein, as part of said assembly process, a mathematical registration correction is made to compensate for drift mismatches between different members of the set {Pn}.