Spatial Feature Analysis via Simultaneous Chip Image Arrays
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Solution Overview
Problem
Manual analysis of spatial imagery data is time-consuming, costly, and prone to human error due to the need for manual panning and zooming operations in conventional computing systems.
Innovation Solution
Implementing systems and methods for efficient spatial feature data analysis by generating and displaying multiple chip images simultaneously, allowing for data-driven pan and zoom operations, and concurrent visualization of feature attributes within a plug-in window, facilitating faster and more accurate analysis.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If manual panning and zooming operations are used to inspect spatial imagery data, then the operator can obtain detailed views of specific features, but the analysis process becomes time-consuming and inefficient
Solution Approach 1:
The patent divides the large spatial imagery into multiple smaller chip images that are displayed simultaneously in a grid array. Each chip image represents a specific geographic area or feature, allowing operators to inspect multiple regions in parallel without sequential panning and zooming operations.
Solution Approach 2:
The patent transitions from a single 2D viewport to a multi-dimensional display architecture where numerous chip images are arranged in a grid array. This additional spatial dimension enables simultaneous visualization of multiple areas, effectively increasing the information throughput and reducing inspection time.
2Productivity
If conventional image analysis software with single viewport is used, then the interface is simple, but the operator must repeatedly pan and zoom to view different areas, reducing productivity
Solution Approach 1:
The patent merges multiple chip images and their associated feature data into a single integrated display window. The grid array of chip images is combined with attribute information panels and navigation controls within one unified interface, allowing operators to access comprehensive information without switching between multiple windows or applications.
Solution Approach 2:
The patent creates a multi-functional interface where a single display window simultaneously provides: (1) grid array of chip images for visual inspection, (2) attribute data panels for feature information, (3) navigation controls for panning and zooming, and (4) selection mechanisms for interacting with specific features. This universal interface consolidates multiple functions that would traditionally require separate tools.
3Reliability
If operators manually inspect each feature by panning and zooming to its location, then detailed examination is possible, but the process is costly and subject to human error
Solution Approach 1:
The patent implements a feedback mechanism where selecting a feature in the chip image array automatically displays its attribute data in an associated panel. This immediate feedback loop allows operators to verify feature characteristics without manual navigation, reducing errors and increasing inspection reliability while maintaining high productivity.
Solution Approach 2:
The patent performs preliminary organization of spatial imagery into structured chip images with associated feature data before the inspection process begins. Features are pre-cataloged with their locations and attributes, so when operators need to inspect specific features, the information is already prepared and accessible, eliminating the need for manual searching and reducing human error.
Data Source
AI summary
Systems (100) and methods (300) for efficient spatial feature data analysis. The methods involve simultaneously generating two or more chip images (904) using image data defining a first image (508); concurrently displaying an array (906) comprising all or a portion of the chip images in a plug-in window (702); and displaying in the plug-in window information relating to an attribute (a1, a2) of a feature (A5) contained in a selected one of the displayed chip images (1002). The chip images are generated in response to a user selection of a feature (A1) contained in at least a portion of the first image displayed in an application window (504). Each of the chip images comprises a panned view, a zoomed view, or a panned-and-zoomed view of the first image including one or more features of a user-selected feature class.