Spatial-Spectral X-Ray and Particle Detection With Light-Valve Readout

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Current x-ray spectrometers are limited by their ability to detect only relatively low x-ray photon fluxes due to the pileup problem caused by overlapping electronic pulses, and reducing pixel size is physically and technologically constrained, leading to lower energy resolution and higher costs.

Innovation Solution

A spectrally and spatially resolved particle detection system using a photoconductive detector with a liquid crystal light valve and high-speed camera, coupled with a computer system to track blooming effects over time, allowing for high-resolution detection of x-ray photons at higher flux rates.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If pixel size is reduced to increase detection rate, then productivity is improved, but measurement precision deteriorates due to larger crosstalk and weighting potential effects

Engineering Contradiction:
Improvedetection rateVSAvoidenergy resolution
Core Design Contradiction:
ProductivityVSMeasurement precision

Solution Approach 1:

The patent replaces the traditional electronic readout system with an optical readout system. Instead of using electronic circuits to detect and measure x-ray photon energies, the invention uses a scintillator to convert x-ray photons into visible light photons, which are then detected by a CCD or CMOS camera. This substitution of electronic detection with optical detection allows for higher detection rates without the pileup problem that limits electronic systems, while maintaining good energy resolution through the optical measurement process.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The patent changes the detection parameter from electronic signal measurement to optical intensity measurement. By using a scintillator material that converts x-ray energy into visible light, the system measures the intensity of emitted light rather than electronic pulses. This parameter change enables the system to handle higher flux rates because optical detection does not suffer from the same pileup limitations as electronic detection, while still providing energy resolution through intensity analysis.

Inventive Principle:
Principle #35Parameter changes

2Measurement precision

If electronic pulse measurement is used to detect individual x-ray photons, then measurement precision is improved, but productivity deteriorates due to pileup problem at higher flux rates

Engineering Contradiction:
Improveenergy measurement accuracyVSAvoidmaximum flux rate
Core Design Contradiction:
Measurement precisionVSProductivity

Solution Approach 1:

The patent replaces the electronic pulse measurement system with an optical detection system using a scintillator and camera. This substitution eliminates the pileup problem inherent in electronic systems because the optical detection process can handle much higher photon flux rates. The scintillator converts incoming x-ray photons into visible light photons that can be detected simultaneously without the timing overlap issues that plague electronic pulse measurement at high flux rates.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The patent uses a scintillator to create an optical copy of the x-ray photon information. Instead of directly measuring the electronic properties of individual x-ray photons, the system converts them into visible light photons that carry the same energy information. This optical copying process allows for parallel detection of multiple photons without the pileup problem, as the camera can capture multiple light photons simultaneously across its pixel array.

Inventive Principle:
Principle #26Copying

3Productivity

If optical coupling with scintillator and camera is used, then productivity is improved by detecting higher flux rates, but measurement precision deteriorates due to light loss in optical system

Engineering Contradiction:
Improvedetection flux rateVSAvoidsignal detection accuracy
Core Design Contradiction:
ProductivityVSMeasurement precision

Solution Approach 1:

The patent uses a scintillator to create an optical copy of the x-ray photon information, converting high-energy x-ray photons into visible light photons that can be efficiently detected by standard CCD or CMOS cameras. This copying process preserves the energy information while enabling detection with optical systems that have high quantum efficiency, thus maintaining measurement precision while achieving high detection rates.

Inventive Principle:
Principle #26Copying

Solution Approach 2:

The patent changes the detection parameter from direct electronic measurement to optical intensity measurement through a scintillator. By selecting scintillator materials with high light output and matching them with cameras having high quantum efficiency in the relevant wavelength range, the system minimizes light loss while maintaining accurate energy measurement capability through intensity analysis.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables high spatial and spectral resolution with the ability to detect x-ray photons at higher flux rates by tracking blooming effects, providing both spatial and energy resolution without the limitations of smaller pixels.

Implementation Method 1

a photoconductive detector, an optical microscope for reading out the photoconductive detector

Methodology Applied
Scientific EffectPhotoconductivity: Photoconductivity

Implementation Method 2

a liquid crystal light valve and high-speed camera

Methodology Applied
Scientific EffectLiquid crystal electro-optic effect: Electro-Optic Effects

Data Source

PatentUS12419591B2Spectrally and spatially resolved x-ray and particle detection system
Publication Date: 2025.09.23 CARL ZEISS X-RAY MICROSCOPY INC
  • US12419591B2 patent drawing
  • US12419591B2 patent drawing
  • US12419591B2 patent drawing

AI summary

A detection system for an x-ray or charged particle imaging system utilizes high bandgap, direct conversion x-ray detection materials. The signal of the x-ray/charged particle projection is recorded in a spatial light modulator such as a liquid crystal (LC) light valve. The light valve is then read-out by a polarized light optical microscope and a high speed camera. The camera is used to track the blooming spots in the light valve to resolve their intensity, and relate that intensity of the input x-ray photon or charged particle. This allows of spatially resolved, imaging, x-ray and/or charged particle spectrometer.