Dual-Axis Specimen Measurement With Zero-Check Calibration
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Solution Overview
Problem
Conventional material testing systems face limitations in efficiently and accurately measuring specimen dimensions, particularly in automated setups, which can affect the precision of material property testing.
Innovation Solution
The implementation of a dual-axis measurement assembly with micrometers and actuators, coupled with a robotic manipulator, allows for automated and precise measurement of specimen dimensions, including a zero-check mechanism to adjust for different specimen sizes and shapes.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Extent of automation
If conventional measurement methods are used in automated material testing systems, then automation is achieved, but measurement precision and accuracy deteriorate
Solution Approach 1:
The measurement system is divided into two independent measurement assemblies, each dedicated to measuring a specific specimen dimension. This segmentation allows each assembly to be optimized for its specific measurement task, maintaining high precision while enabling automated operation through independent control of each measurement function.
Solution Approach 2:
A robotic manipulator serves as an intermediary device that automatically positions specimens between the two measurement assemblies. This intermediary mechanism enables automated specimen handling and positioning without compromising the precision of the measurement assemblies themselves.
2Measurement precision
If manual adjustments are made for different specimen sizes and shapes, then measurement accuracy is maintained, but productivity and efficiency deteriorate
Solution Approach 1:
The measurement system incorporates adjustable components that can dynamically adapt to different specimen sizes and shapes. The measurement assemblies can be repositioned and reconfigured automatically, allowing the system to maintain measurement accuracy across various specimen types without manual intervention, thereby improving productivity.
Solution Approach 2:
The system changes measurement parameters such as probe positions, anvil locations, and measurement ranges automatically based on specimen characteristics. This parameter adaptation enables the system to maintain precision for different specimen types while operating in an automated manner, eliminating the need for manual adjustments.
3Device complexity
If a single measurement assembly is used, then device complexity is reduced, but the ability to measure multiple specimen dimensions simultaneously deteriorates
Solution Approach 1:
The system uses two separate measurement assemblies, each designed for a specific dimension measurement task. This segmentation provides versatility in measuring multiple specimen dimensions while keeping each individual assembly relatively simple in design, balancing complexity and adaptability.
Solution Approach 2:
Each measurement assembly is designed with universal capabilities to handle different specimen types and dimensions within its measurement scope. The robotic manipulator provides multi-functional positioning capabilities, enabling the system to measure various specimen dimensions automatically without requiring highly complex specialized equipment for each dimension.
Data Source
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AI summary
Disclosed example test specimen measurement apparatus include: a first measurement assembly configured to measure a first specimen dimension in a first direction, the first measurement assembly comprising: a first anvil oriented along the first direction; a first micrometer oriented along the first direction and configured to output a first measurement; a first actuator configured to actuate the first micrometer with respect to the first anvil; and a second actuator configured to actuate the first micrometer and the first anvil simultaneously along the first direction; and a second measurement assembly configured to measure a second specimen dimension in a second direction, the second measurement assembly comprising: a second anvil oriented along the second direction; a second micrometer oriented along the second dimension and configured to output a second measurement; and a third actuator configured to actuate the second micrometer with respect to the second anvil.