Speckle-Based Imaging Diffuser With Controlled Absorption

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Solution Overview

Problem

Existing speckle-based x-ray phase contrast imaging masks lack control over absorption and feature sizes, are not compatible with higher energy x-ray sources, and are difficult to duplicate, leading to inconsistent performance and ambiguous correlations.

Innovation Solution

A mask for speckle-based XPCI systems with controlled speckle size, absorption, and phase change properties, fabricated using methods such as photolithography and electrodeposition, employing materials like silicon, glass, and metals to create a pseudo-random binary array pattern on an x-ray transparent substrate.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If conventional masks (sandpaper, wire meshes, steel wool, biological membranes) are used, then speckle patterns are produced, but control over absorption degree and feature sizes is lost

Engineering Contradiction:
Improvecontrol over absorption and feature sizesVSAvoidfabrication complexity
Core Design Contradiction:
Manufacturing precisionVSEase of manufacture

Solution Approach 1:

The mask is segmented into discrete features (spheres, cylinders, or other geometric shapes) with controlled sizes and spacing. These segmented features are arranged in pseudo-random patterns, allowing independent control of absorption properties and feature dimensions while maintaining manufacturability through standardized fabrication processes.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Different regions of the mask can have locally optimized properties by varying feature size, material composition, and spacing. This allows tailored absorption characteristics in different zones of the mask while maintaining overall consistency, achieved through programmable fabrication methods that can adjust parameters locally.

Inventive Principle:
Principle #3Local quality

2Adaptability or versatility

If conventional masks are used, then speckle patterns are generated, but compatibility with higher energy x-ray sources is reduced

Engineering Contradiction:
Improvecompatibility with various x-ray energiesVSAvoidperformance consistency
Core Design Contradiction:
Adaptability or versatilityVSReliability

Solution Approach 1:

The mask design incorporates adjustable parameters including feature size, material atomic number, and thickness that can be optimized for different x-ray energy ranges. This allows the same mask fabrication approach to be adapted for low-energy, medium-energy, and high-energy x-ray sources by simply changing these parameters rather than requiring entirely different mask types.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The mask employs composite structures combining different materials with varying atomic numbers and absorption characteristics. This multi-material approach enables tuning of the overall absorption profile to match specific x-ray energy sources, improving versatility across different imaging systems while maintaining reliable performance through controlled material properties.

Inventive Principle:
Principle #40Composite materials

3Reliability

If conventional masks are used, then imaging can be performed, but duplication and performance reproduction become difficult

Engineering Contradiction:
Improveperformance consistencyVSAvoidmask duplication capability
Core Design Contradiction:
ReliabilityVSEase of manufacture

Solution Approach 1:

The mask design uses digitally generated pseudo-random patterns that can be precisely copied and reproduced through photolithography or other programmable fabrication methods. This ensures identical performance characteristics across multiple masks, as each can be manufactured from the same digital blueprint, eliminating variability between hand-crafted or naturally formed masks.

Inventive Principle:
Principle #26Copying

Solution Approach 2:

The mask pattern is pre-designed and validated through simulation before fabrication. This preliminary digital modeling allows optimization of performance parameters and ensures that the fabricated mask will meet specifications, enabling consistent reproduction of performance across different manufacturing batches and facilities.

Inventive Principle:
Principle #10Preliminary action

4Measurement precision

If conventional masks are used, then speckle patterns are created, but ambiguous correlations occur in image reconstruction

Engineering Contradiction:
Improveimage reconstruction accuracyVSAvoidmask pattern control
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The mask employs asymmetric, non-repeating pseudo-random patterns rather than symmetric or periodic structures. This asymmetry ensures that each region of the mask produces a unique speckle pattern, eliminating ambiguous correlations during image reconstruction. The controlled randomness provides sufficient statistical variation for accurate reconstruction while maintaining manageable fabrication complexity through digital pattern generation.

Inventive Principle:
Principle #4Asymmetry

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution provides consistent statistics, unique speckle patterns, and compatibility with various x-ray energies, enhancing image reconstruction and reducing signal drop-outs, especially for high-energy sources.

Implementation Method 1

The mask having x-ray absorption and/or x-ray phase-changing properties

Methodology Applied
Scientific EffectX-ray absorption: Absorption (EM radiation)

Implementation Method 2

The mask having x-ray absorption and/or x-ray phase-changing properties

Methodology Applied
Scientific EffectX-ray phase change: Phase Change

Data Source

PatentUS12424346B1Speckle-based imaging diffuser and method for controllably fabricating same
Publication Date: 2025.09.23 NATIONAL TECHNOLOGY & ENGINEERING SOLUTIONS OF SANDIA LLC
  • US12424346B1 patent drawing
  • US12424346B1 patent drawing
  • US12424346B1 patent drawing

AI summary

A mask for use in a speckle-based x-ray or neutron phase contrast imaging system and methods of making the mask are disclosed. The mask may either absorb or change the phase of the incident x-ray or neutron beam. The mask in various embodiments has consistent statistics across the mask, is locally unique (thereby avoiding ambiguous correlations), has a speckle size on the order of the imaging system's resolution, has a speckle pattern that is visible through the sample being imaged, and/or is matched to the energy level of the imaging system and the sample density. These mask attributes are controlled by the method and materials used in the fabrication of the mask. Various embodiments use a pseudo-random binary array for generating the required speckle pattern.