Speckle Wavefront Imaging for Full-Coverage 3D Measurement
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Solution Overview
Problem
Existing optical speckle-based measurement methods provide limited sample coverage, lack spatial resolution, and are sensitive to external vibrations, making them less robust and requiring complex setups for full characterization of objects and samples.
Innovation Solution
A system utilizing coherent and incoherent light sources with controlled optical properties to induce and capture speckle patterns, combined with a wavefront imaging sensor, allows for full sample coverage and high spatial resolution in measuring deformation, vibration, and orientation, enabling 2D and 3D imaging without complex setups.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If optical speckle-based measurement is used, then non-contact measurement of properties such as motion, orientation, vibration, and deformation can be achieved, but sample coverage is limited and spatial resolution is insufficient
Solution Approach 1:
The patent segments the illumination into multiple coherent light beams that illuminate different regions of the sample simultaneously. Each beam generates speckle patterns that are captured and processed to provide spatially resolved measurements across the entire sample area, thereby achieving both full sample coverage and high spatial resolution
Solution Approach 2:
The patent transitions from traditional 2D speckle pattern capture to 3D wavefront imaging by measuring both intensity and phase information. This dimensional enhancement allows for comprehensive characterization of sample properties including surface topology, deformation, and orientation with improved spatial resolution across the entire sample area
2Reliability
If traditional speckle-based measurement methods are used, then non-contact measurement can be performed, but the system is sensitive to external vibrations and lacks robustness
Solution Approach 1:
The patent implements feedback mechanisms where the measured wavefront phase information is used to compensate for vibrations and environmental disturbances in real-time. The system continuously monitors speckle pattern changes and adjusts measurements to maintain accuracy despite external perturbations, thereby enhancing robustness and reliability
Solution Approach 2:
The patent performs preliminary calibration and reference measurements to establish baseline wavefront characteristics before actual measurements. This preliminary action allows the system to distinguish between measurement signals and vibration-induced noise, improving robustness against external disturbances
3Adaptability or versatility
If complex setups are used for full characterization of objects, then comprehensive measurements can be achieved, but device complexity increases
Solution Approach 1:
The patent employs a universal wavefront imaging system that can perform multiple measurement functions including 2D imaging, 3D surface profiling, deformation measurement, and vibration analysis using a single integrated setup. This multi-functional approach achieves full characterization capability without requiring multiple separate measurement systems
Solution Approach 2:
The patent replaces complex mechanical measurement systems with optical wavefront sensing. By using coherent light interference patterns and phase measurement, the system achieves comprehensive object characterization without mechanical contact or complex mechanical scanning mechanisms, thereby reducing device complexity
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The system provides comprehensive sample characterization with improved sensitivity and robustness, allowing for detailed measurements of sample properties like reflectivity, shape, and 3D structure, while distinguishing between different parts of the sample and reducing sensitivity to external vibrations.
Implementation Method 1
Optical speckle-based measurement is a method for non-contact measurement of objects and samples
Implementation Method 2
a wavefront imaging sensor/s to capture a wavefront image of the light returned from the sample
Data Source
Figure 1~2a
Figure 2b~3
Figure 4
AI summary
There are provided systems and methods for imaging, measuring an object, and characterizing a sample. An optical, speckle-based imaging system may comprise an illumination unit comprising at least one coherent light source to illuminate a sample; a collection unit for collecting input light from the sample, the collection unit consisting of an imaging optics and a wavefront imaging sensor; and a control unit coupled to the illumination unit and the collection unit for analyzing the input light and generating a speckle wavefront image, wherein the at least one coherent light source is to generate primary speckles in the sample or thereon, and the imaging optics is to capture a secondary speckle pattern induced by the illumination unit in the sample or thereon.