Spectral Detector Using Multi-Period Grating Panel
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Solution Overview
Problem
Existing spectral detectors face challenges in achieving high resolution in small sizes due to limitations in manufacturing fine diffraction gratings and filter arrays, which restrict the number of filters that can be used, affecting the resolution and portability of spectrometers.
Innovation Solution
A spectral detector utilizing a grating panel with multiple grating patterns of different periods, coupled with an optical measurement panel and a processor, measures changes in light intensity to calculate wavelength spectra and adjust for differences, enabling precise wavelength analysis and correction for incidence angle errors using the Talbot effect.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a fine diffraction grating is manufactured to achieve high resolution, then spectral resolution is improved, but the device size increases and portability is reduced
Solution Approach 1:
The grating panel is divided into multiple grating patterns with different periods (first grating pattern with first period, second grating pattern with second period). Each grating pattern processes different wavelength ranges, enabling high-resolution spectral analysis across the entire spectrum without requiring a single large-scale grating structure.
Solution Approach 2:
The patent transitions from spatial resolution (physical grating size) to temporal resolution (measurement time). By using multiple grating patterns with different periods, the system achieves high spectral resolution through sequential measurement and processing of intensity changes over time, rather than relying on a large physical grating structure.
2Measurement precision
If the number of filters is increased to improve resolution in filter array-based spectrometers, then spectral resolution is improved, but manufacturing complexity and device size increase
Solution Approach 1:
The optical measurement panel serves multiple functions: it measures intensity changes for multiple grating patterns with different periods, and these measurements are processed to obtain spectral information across different wavelength ranges. This multi-functional approach eliminates the need for separate filter arrays for different spectral regions.
Solution Approach 2:
The system changes the period parameter of the grating patterns (first period, second period) to cover different wavelength ranges. By varying the grating period rather than using multiple filters, the system achieves spectral resolution improvement with simpler manufacturing and reduced device complexity.
3Device complexity
If a single grating pattern is used, then device simplicity is maintained, but spectral resolution and wavelength range coverage are limited
Solution Approach 1:
The grating panel is segmented into multiple grating patterns with different periods, where each pattern is optimized for specific wavelength ranges. This segmentation enables comprehensive spectral coverage and high resolution while maintaining the simplicity of the overall grating panel structure.
Solution Approach 2:
Multiple grating patterns with different periods are merged into a single grating panel, allowing simultaneous use of different grating structures for spectral analysis. The optical measurement panel combines measurements from all grating patterns to achieve high-resolution spectral information across the entire wavelength range.
4Device complexity
If incidence angle errors are not corrected, then device simplicity is maintained, but measurement accuracy deteriorates
Solution Approach 1:
The system uses feedback from multiple grating patterns to detect and correct incidence angle errors. By comparing intensity change measurements from grating patterns with different periods, the processor can identify angle deviations and apply corrections to maintain measurement accuracy.
Solution Approach 2:
The measurement system uses a composite approach by combining data from multiple grating patterns with different periods. This composite measurement strategy enables error detection and correction, improving wavelength measurement accuracy while maintaining relative system simplicity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach allows for high-resolution spectral analysis in a compact form, improving the reliability and precision of spectral detection by correcting for incidence angle errors and enabling the use of multiple grating patterns to enhance resolution.
Implementation Method 1
a method of dispersing light by transmitting incident light through a crystal structure having a periodic structure so that the light may travel in different directions according to wavelengths thereof
Implementation Method 2
Transform spectrometer based on measuring the periodicity of Talbot self-images
Implementation Method 3
measure a change in intensity of first light passing through the first grating pattern according to a propagation distance of the first light
Data Source
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AI summary
A spectral detector includes a grating panel including a first grating pattern having a first period, a second grating pattern having a second period that is different from the first period, and a light exit surface through light exits the grating panel, and an optical measurement panel arranged to face the light exit surface of the grating panel, and configured to measure a change in intensity of first light passing through the first grating pattern according to a propagation distance of the first light, and to measure a change in intensity of second light passing through the second grating pattern according to a propagation distance of the second light.