Spectral Line Assignment Confidence in Optical Emission Spectroscopy

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Solution Overview

Problem

Current spectroscopic techniques, such as LIBS, lack a quantitative measure of confidence in spectral line assignments, leading to inaccuracies and uncertainties due to low resolution, dynamic plasma conditions, and reliance on qualitative databases, which affects the precision and reliability of elemental identification.

Innovation Solution

A computer-implemented method that quantitatively determines the level of confidence for spectral line assignments by normalizing emission strengths and using multimodal probability distributions to analyze spectral peaks, allowing for a more accurate and precise identification of emitters in the spectrum.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Device complexity

If low-resolution spectral analyzers are used to detect spectral lines, then the device complexity and cost are reduced, but the measurement precision and reliability of elemental identification deteriorate due to spectral interferences and line broadening

Engineering Contradiction:
Improvespectral analyzer complexityVSAvoidspectral line assignment precision
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

The patent introduces a plasma condition model as an intermediary that mediates between the low-resolution spectral measurements and the elemental identification. This model incorporates plasma broadening and shifting effects to correct the spectral line assignments, allowing accurate identification even with low-resolution analyzers by compensating for the inherent measurement limitations through physical modeling of the plasma environment.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent changes the approach from direct spectral line matching to a probability-based assignment that incorporates multiple parameters including plasma conditions, emission strengths, and spectral broadening effects. By transforming the analysis into a quantitative probability framework that accounts for dynamic plasma parameters, the system achieves high measurement precision despite using low-resolution instrumentation.

Inventive Principle:
Principle #35Parameter changes

2Ease of operation

If qualitative databases are used for spectral line assignment, then the ease of operation is improved, but the reliability and accuracy of identification deteriorate due to lack of quantitative confidence measures

Engineering Contradiction:
Improvespectral analysis operation easeVSAvoidelemental identification reliability
Core Design Contradiction:
Ease of operationVSReliability

Solution Approach 1:

The patent implements a feedback mechanism that provides quantitative confidence levels for each spectral line assignment. The system continuously refines the probability of emission based on observed spectral data and compares it against the database, providing operators with reliable confidence measures that indicate the accuracy of each identification. This feedback loop maintains ease of operation while dramatically improving reliability through automated quantitative evaluation.

Inventive Principle:
Principle #23Feedback

Solution Approach 2:

The patent replaces the manual, experience-based spectral analysis approach with an automated computer-implemented system that uses mathematical models and probability calculations. By substituting the mechanical process of manual spectral interpretation with computational algorithms that quantitatively evaluate emission probabilities and compare them against calibrated databases, the system achieves both ease of operation and high reliability through consistent, reproducible results.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

3Adaptability or versatility

If dynamic plasma conditions are present causing broadening and shifting of spectral lines, then the adaptability of the analysis to real-world conditions is improved, but the measurement precision deteriorates due to spectral line interference

Engineering Contradiction:
Improveplasma condition adaptabilityVSAvoidspectral line position precision
Core Design Contradiction:
Adaptability or versatilityVSMeasurement precision

Solution Approach 1:

The patent incorporates dynamic plasma condition parameters into the analysis model, allowing the system to adapt to real-time changes in plasma temperature, density, and other conditions that cause spectral line broadening and shifting. By using time-varying models that account for these dynamic effects, the system maintains measurement precision despite the presence of dynamic plasma conditions, as the model continuously adjusts to match the actual physical state of the plasma during analysis.

Inventive Principle:
Principle #15Dynamics

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enhances the accuracy and precision of spectral line assignments, providing a quantitative measure of confidence that can improve the reliability of elemental identification, even with low-resolution spectral analyzers and dynamic plasma conditions, and enables better decision-making in applications like forensic science and quality control.

Implementation Method 1

Spectroscopic techniques based on emission (LIBS, ICP-OES, GD-OES, Arc, Spark, etc.), rely on the assignment of the spectral peaks in a spectrum to know the composition of the material that is analyzed

Methodology Applied
Scientific EffectOptical emission spectroscopy:

Data Source

PatentUS10001410B2Quantitative elemental profiling in optical emission spectroscopy
Publication Date: 2018.06.19 UNIVERSITY OF CENTRAL FLORIDA RESEARCH FOUNDATION INC
  • US10001410B2 patent drawing
  • US10001410B2 patent drawing
  • US10001410B2 patent drawing

AI summary

The current invention considers the spectrum as a multimodal distribution over a list of structures containing the wavelength as the main entry and the other information mentioned above in the list as additional entries. Each line is then given a probability of contributing to the spectral line. In the case of multiple spectral lines, inference between spectral lines and their respective levels of confidence will provide a complete picture of the list of probable emitters with a probability factor for each line in order to provide a quantitative assignment of the spectral lines and profiling for a given spectrum.