Spectral Characteristic Measuring Device Wavelength Shift Correction
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Solution Overview
Problem
Existing spectral characteristic measuring devices face challenges in accurately correcting for wavelength shifts due to changes in spectral distribution and thermal/thermal changes, particularly when using plastic molded components in polychromators, which affect measurement accuracy.
Innovation Solution
A spectral characteristic measuring device with a control unit that includes a storage unit for wavelength information, an intensity distribution acquiring portion, and calculation portions to estimate and correct for wavelength shifts by comparing intensity distributions from primary and secondary diffracted light, using a predetermined relational expression to account for differences in light receiving element efficiency.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If monochromatic light is used to obtain first and second image shift amounts for wavelength correction, then wavelength shift correction can be performed, but the shapes of dispersion images change due to spectral distribution variations causing inaccurate shift amount measurement
Solution Approach 1:
The patent introduces a reference specimen with known spectral characteristics as an intermediary standard. By comparing the measured spectral characteristics against this reference, the system can accurately determine wavelength shifts even when dispersion image shapes change, thereby maintaining measurement reliability while enabling wavelength correction
Solution Approach 2:
The system changes the approach from measuring physical image shift amounts to measuring spectral characteristic parameters. By analyzing changes in spectral distribution parameters rather than relying on fixed image shapes, the method maintains accuracy despite variations in dispersion image morphology caused by temperature or temporal changes
2Measurement precision
If correction is performed using existing techniques requiring specific reference specimens, then wavelength shift can be corrected, but measurement time increases and noise influence is amplified
Solution Approach 1:
The patent creates a correction method that serves multiple functions simultaneously: it performs wavelength shift correction, adapts to different spectral conditions, and reduces noise influence all through a single spectral characteristic comparison process. This universal approach eliminates the need for separate correction procedures using specific reference specimens, thereby reducing measurement time while maintaining or improving accuracy
Solution Approach 2:
The system creates a reference spectral characteristic profile that can be copied and compared against multiple measurements. This reference copy contains the expected spectral characteristics under various conditions, allowing rapid comparison and correction without requiring physical reference specimens for each measurement, thus reducing time and noise influence
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables rapid and accurate correction of spectral characteristics regardless of changes in spectral distribution, reducing the need for specific reference specimens and minimizing measurement time, while improving accuracy and reducing noise influence.
Implementation Method 1
a diffraction grating that disperses the light passed through the opening according to a wavelength
Implementation Method 2
a light receiving unit in which a plurality of light receiving elements is arrayed... that outputs a signal from each of the light receiving elements according to an irradiation light quantity
Data Source
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AI summary
The purpose is to rapidly and easily correct a spectral characteristic measuring device regardless of the change in spectral distribution of a monochromatic light for correction. To achieve the object, a spectral characteristic measuring device includes a spectrometer and a control device. In the spectrometer, the light passed through an opening of a light shielding body is dispersed by an optical system and irradiated on a light receiving unit in which a plurality of light receiving elements are arrayed to form a dispersion image. In the control device, wavelength information indicating a correspondence relationship between the plurality of light receiving elements and wavelengths of pieces of lights is stored, where first and second intensity distributions of the light related to first and second dispersion images are acquired based on a signal outputted from each of the light receiving elements when the monochromatic light is passed through the opening and first and second dispersion images related to primary diffracted light and secondary diffracted light are formed on the light receiving unit, and an estimated intensity distribution of the light related to the second dispersion image is calculated from the first intensity distribution according to a predetermined relational expression. In the control device, a change amount related to the wavelength information is calculated based on the estimated intensity distribution and the second intensity distribution, and the wavelength information is corrected according to the change amount.