Spectral Shift Correction in Measurement Apparatus

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Solution Overview

Problem

Existing color measurement systems face measurement errors due to wavelength fluctuations of the light source and wavelength detection errors on the sensor side, which cannot be accurately corrected, leading to inaccurate color reproducibility and image quality.

Innovation Solution

A measurement apparatus comprising a light emitting means, a light receiving means with multiple light-receiving elements, a temperature detection means, and a determination means to correct wavelength fluctuations by determining the correspondence between light-receiving elements and wavelengths based on temperature data, allowing for accurate spectral reflectance calculation.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If factory adjustment is performed to align light-receiving elements with wavelengths, then wavelength detection accuracy is improved, but measurement error occurs when temperature changes cause thermal expansion of holding members

Engineering Contradiction:
Improvewavelength detection accuracyVSAvoidmeasurement stability under temperature change
Core Design Contradiction:
Measurement precisionVSReliability

Solution Approach 1:

The patent applies parameter changes by detecting temperature variations and using them to calculate wavelength shift amounts. The system dynamically adjusts the wavelength assignment for each light-receiving element based on the detected temperature, compensating for thermal expansion effects without requiring mechanical re-adjustment of the sensor components.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent implements feedback by continuously monitoring temperature changes and using this information to correct wavelength detection errors in real-time. The temperature detection unit provides feedback to the correction unit, which then adjusts the spectral reflectance calculation based on the detected temperature-induced wavelength shifts.

Inventive Principle:
Principle #23Feedback

2Reliability

If peak pixel moving amount is used to detect wavelength shift, then correction is attempted, but accurate detection is impossible when both light source wavelength fluctuation and sensor wavelength detection error co-occur

Engineering Contradiction:
Improvewavelength shift correction capabilityVSAvoidwavelength detection error accuracy
Core Design Contradiction:
ReliabilityVSMeasurement precision

Solution Approach 1:

The patent extracts the temperature parameter as a separate, independently measurable quantity that correlates with wavelength shifts. By measuring temperature directly rather than attempting to measure the combined effect of light source fluctuation and sensor error, the system can isolate and correct for wavelength shifts without the confounding factors present in peak pixel moving amount methods.

Inventive Principle:
Principle #2Taking out (Extraction)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution effectively corrects wavelength-related errors, enhancing measurement accuracy and improving color reproducibility and image quality by accurately determining and correcting wavelength shifts caused by temperature changes.

Implementation Method 1

a light receiving means for receiving a reflected light from a measurement target

Methodology Applied
Scientific EffectLight reflection: Reflection

Implementation Method 2

a holding member which holds each part thermally expands upon a temperature change. Then, the positional relationship between parts deviates

Methodology Applied
Scientific EffectThermal expansion: Thermal Expansion

Data Source

PatentUS10078012B2Measurement apparatus with adjustment for spectral shift
Publication Date: 2018.09.18 CANON KK
  • US10078012B2 patent drawing
  • US10078012B2 patent drawing
  • US10078012B2 patent drawing

AI summary

A measurement apparatus comprises: a light emitting means for emitting a light; a light receiving means for receiving a reflected light from a measurement target, the light receiving means comprises a plurality of light-receiving elements; a detection means for detecting a temperature of the light emitting means; a determination means for determining a correspondence between each light-receiving element of the light receiving means and a wavelength of the reflected light from the measurement target based on a result of receiving the reflected light from a reference element and the temperature of the light emitting means detected by the detection means; and an output means for outputting spectral reflectance information for the measurement target based on a result of receiving the reflected light from the measurement target and the correspondence determined by the determination means.