Spectrometer Bias Determination via Grating Over-Scanning
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Solution Overview
Problem
Miniaturized spectrometer systems face challenges in accurately determining bias due to limited space for mechanical shutters and reduced accuracy in existing methods, necessitating a more innovative approach for bias determination.
Innovation Solution
The method involves over-scanning a grating in a near-zero-response wavelength range to determine bias, using a filter-absorbing wavelength region where the detector's response is minimal, and employing a combination of masked and unmasked detector elements to calculate bias adjustment values, eliminating the need for mechanical shutters and improving accuracy.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a mechanical shutter is used to determine bias in a scanning spectrometer, then bias determination accuracy is improved, but device complexity and space requirements increase
Solution Approach 1:
The patent replaces the mechanical shutter system with an optical filtering approach. Instead of using a physical shutter that moves to block light, the invention uses a fixed optical filter (such as a long-pass or short-pass filter) positioned in the optical path to selectively block specific wavelength ranges. This substitution eliminates moving mechanical parts while achieving the same bias determination function through wavelength-selective absorption.
Solution Approach 2:
The patent extracts the shutter function from the mechanical system and implements it through a stationary optical filter. The filter is designed to absorb light in specific wavelength regions (near-zero-response wavelength range), effectively removing the need for mechanical movement. This extraction separates the bias determination function from the mechanical positioning system.
2Measurement precision
If a mechanical shutter is installed in miniaturized spectrometer systems, then bias determination capability is improved, but space constraints are violated
Solution Approach 1:
The patent replaces the mechanical shutter with a stationary optical filter that requires no moving parts. The filter is mounted fixed in the optical path, eliminating the need for space-consuming mechanical assemblies. This substitution is particularly important for miniaturized spectrometers where every cubic inch counts.
Solution Approach 2:
The patent removes the mechanical shutter component entirely and replaces it with a stationary optical filtering element. This extraction of the mechanical system allows the spectrometer to achieve bias determination capability without the space requirements of mechanical movement, enabling miniaturization.
3Measurement precision
If over-scanning is performed in a near-zero-response wavelength range, then bias determination accuracy is improved, but measurement time increases
Solution Approach 1:
The patent performs the over-scan in a near-zero-response wavelength range as a preliminary action during the normal measurement process. By positioning the filter to block wavelengths where the detector has minimal response, the system can determine bias without requiring separate, time-consuming measurement sequences. The over-scan occurs automatically as part of the standard scanning operation.
Solution Approach 2:
The patent changes the wavelength parameter by directing the detector to measure in a near-zero-response wavelength range (using the optical filter to select these wavelengths). This parameter change allows bias determination to occur during normal operation without adding significant time, as the detector is already scanning through the spectrum and simply focuses on a specific wavelength region where the filter absorbs light.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach allows for precise bias determination in compact spectrometer systems, enhancing accuracy and reducing mechanical complexity, while maintaining or improving measurement quality.
Implementation Method 1
a wavelength range in a filter-absorbing wavelength region of a filter in the optical path of a detector used to perform the over-scan
Implementation Method 2
a diffraction grating is rotated through a specified angle to bring the desired wavelengths to the detector
Data Source
AI summary
A system and method for determining bias in a spectrometer is described. One embodiment includes a method for determining bias in a spectrometer system, the method comprising over-scanning a grating in a near-zero-response wavelength range; and determining a bias based on the over-scanning. This methodology allows for over-scanning a grating in a near-zero-response wavelength range as a substitute for using shutters or other mechanisms to block light from entering a detector in the system.