Spectrometer Field-of-View Overlap for Granular Material Accuracy

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Solution Overview

Problem

Spectrometer devices are sensitive to the granularity of objects, leading to measurement errors when individual sensor signals are combined, particularly in applications involving granular materials.

Innovation Solution

A spectrometer device with a detector array of pixelated sensors, an optical filter to separate wavelength signals, and optical elements that modify the field of view to increase overlap between sensor fields, allowing for robust signal combination.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If individual sensors measure different portions of the spectrum with narrow field of views, then spectral resolution is improved, but measurement precision deteriorates due to granularity sensitivity

Engineering Contradiction:

Improvespectral resolutionVSAvoidmeasurement accuracy

Core Design Contradiction:

Manufacturing precisionVSMeasurement precision

Solution Approach 1:

The patent combines multiple sensor signals that have overlapping fields of view to create a composite spectrum. By merging the signals from multiple sensors rather than treating them separately, the system achieves both spectral resolution (through wavelength-specific filtering) and measurement accuracy (through redundancy and averaging of granularity effects).

Inventive Principle:

Principle #5Merging (Combining)

Solution Approach 2:

The patent introduces spatial overlap as an additional dimension to the spectral measurement. Instead of only separating measurements by wavelength, the system creates overlap in the spatial domain (field of view) to provide redundant measurements of the same granular material, thereby reducing sensitivity to local granularity variations.

Inventive Principle:

Principle #17Another dimension (Dimensionality change)

2Adaptability or versatility

If field of views of adjacent sensors are separated, then spectral coverage is improved, but measurement precision deteriorates due to increased granularity sensitivity

Engineering Contradiction:

Improvespectral coverageVSAvoidmeasurement accuracy

Core Design Contradiction:

Adaptability or versatilityVSMeasurement precision

Solution Approach 1:

The patent applies different field of view configurations to different sensors within the array. Each sensor can have optimized field of view parameters tailored to its specific spectral band while maintaining appropriate overlap with adjacent sensors. This local optimization allows both comprehensive spectral coverage and reduced granularity sensitivity.

Inventive Principle:

Principle #3Local quality

3Manufacturing precision

If optical filters separate wavelength signals for individual sensors, then spectral resolution is improved, but device complexity increases

Engineering Contradiction:

Improvespectral resolutionVSAvoidsystem complexity

Core Design Contradiction:

Manufacturing precisionVSDevice complexity

Solution Approach 1:

The patent designs the optical filter system so that multiple sensors share common optical path elements and filtering mechanisms. The filters are configured to handle multiple wavelength bands across the sensor array, reducing the total number of discrete filter components needed while maintaining high spectral resolution for each sensor.

Inventive Principle:

Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution enhances measurement accuracy by reducing the impact of object granularity, enabling precise spectrum detection and reducing measurement errors.

Implementation Method 1

an optical filter, wherein the optical filter is arranged within the field of views of the at least two pixelated sensors, wherein the optical filter is configured for generating a spectrum of at least two separated wavelength signals from the incident radiation and transmitting the at least two separated wavelength signals onto the respective at least one pixelated sensor

Methodology Applied

Scientific EffectOptical filtering: Filter (optical)

Implementation Method 2

at least one optical element configured for modifying the field of view of at least one pixelated sensor by increasing at least one overlap between the field of views of the at least two pixelated sensors

Methodology Applied

Scientific EffectRefraction: Refraction

Implementation Method 3

Methodology Applied

Scientific EffectReflection: Reflection

Implementation Method 4

each pixelated sensor is configured for generating at least one detector signal related to the accepted incident radiation

Methodology Applied

Scientific EffectPhotoelectric effect: Photoelectric Effect

Data Source

PatentUS20260043737A1Spectrometer device and system for detecting incident radiation generated by an object

Publication Date: 2026.02.12 TRINAMIX GMBH

AI summary

Disclosed herein is a spectrometer device for detecting incident radiation generated by an object and a spectrometer systemThe spectrometer device and the spectrometer system for detecting incident radiation generated by an object includes: a measurement window, a detector array, an optical filter, and at least one optical element configured for modifying the field of view of at least one pixelated sensor by increasing at least one overlap between the field of views of the at least two pixelated sensors.Further described herein is the advantage that the spectrometer device and the spectrometer system are robust against the granularity of an object, particularly by providing a sensor signal that may be correlated in a common measurement result, as the fields of view of the single pixelated sensors have an increased overlap.