Spectrometer Order Sorting Filter for Continuous Scanning
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Solution Overview
Problem
Conventional spectrometers face challenges in performing continuous scans over wide wavelength ranges, such as 200 nm to 1000 nm, due to the need for multiple filter changes and interruptions in the movement of the monochromator's diffraction grating, which are time-consuming and hinder quick measurements.
Innovation Solution
A spectrometer combining a monochromator with an order sorting filter that can be moved continuously and synchronously with the diffraction grating, utilizing an order sorting filter with alternately applied optical thin layers on a quartz substrate, allowing for continuous acquisition of absorption spectra without stopping the grating, and using only two or more zones for spectral separation.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If conventional spectrometers use multiple filter changes to cover wide wavelength ranges, then spectral coverage is improved, but measurement time increases and productivity decreases
Solution Approach 1:
The patent combines multiple long-pass filters with different cutoff wavelengths (350 nm, 450 nm, 550 nm) onto a single substrate to create one integrated order-sorting filter. This merged structure allows all filters to be positioned simultaneously in the optical path, enabling continuous wavelength scanning across 200-1000 nm without filter changes, thus resolving the contradiction between spectral coverage and measurement speed
Solution Approach 2:
The single substrate serves multiple functions by hosting multiple long-pass filters that operate simultaneously. This multi-functional design allows one filter component to replace what would traditionally require multiple separate filter elements, enabling wide spectral coverage while maintaining continuous operation and high productivity
2Manufacturing precision
If the monochromator grating is stopped for filter changes, then filter positioning accuracy is improved, but scanning continuity is reduced and time is lost
Solution Approach 1:
All long-pass filters are pre-positioned on the single substrate at their correct locations corresponding to different wavelength ranges. This preliminary arrangement eliminates the need for stopping the grating to change filters during scanning, as all filters are already in place and will be sequentially activated based on the grating's angular position, thus resolving the contradiction between positioning accuracy and scanning continuity
Solution Approach 2:
The patent enables continuous scanning by having all filters simultaneously available in the optical path. The system continuously scans wavelengths from 200-1000 nm without interruptions, as the appropriate long-pass filter is already positioned to block higher-order diffraction light at each wavelength range, eliminating scanning interruptions and time loss
3Device complexity
If thin-film stack filters are arranged on a common substrate, then device complexity is reduced, but interference effects between filters may increase
Solution Approach 1:
The substrate is divided into multiple zones, with each zone containing a specific long-pass filter. This segmentation spatially separates the filters on the substrate, reducing overlap and interference between adjacent filter structures. Each filter operates in its designated zone, minimizing harmful interference effects while maintaining the benefits of a unified substrate structure
Solution Approach 2:
Different regions of the substrate are optimized for specific filter types and configurations. Each local zone is designed with appropriate film thicknesses and materials tailored to its specific wavelength range, allowing each filter to perform optimally with minimal interference from neighboring filters, thus resolving the contradiction between structural simplicity and interference reduction
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables rapid acquisition of absorption spectra over 200 nm to 1000 nm in 1 nm increments in less than five seconds, with a cost-effective and robust design that reduces precision requirements for the filter movement and minimizes interference effects.
Implementation Method 1
a monochromator (3) with a diffraction grating (4)
Implementation Method 2
an order sorting filter (7) with alternately applied optical thin layers (24, 25) on a quartz substrate (23)
Implementation Method 3
spectrometer with a monochromator and order sorting filter for absorption spectrometry of samples in microplate wells
Data Source
Figure 1A~4
Figure 5~6B
Figure 7A
AI summary
A spectrometer (1) comprises a light source (2), a monochromator (3) with at least one diffraction grating (4), a monochromator housing (5), an order-sorting filter (7), a microplate holder (12), and a controller (6). The order-sorting filter (7) of this spectrometer (1) comprises a substrate (23), a first optical thin film (24), and a second optical thin film (25), wherein the first optical thin film (24) is arranged on a first surface (26) and the second optical thin film (25) is arranged on a second surface (27) of the substrate (23) in a spatially partially overlapping and interference-free manner. A spectrometer (1) equipped with a corresponding order-sorting filter is used in a scanning method for acquiring the absorption spectrum of samples examined in wells (14) of microplates (13).