Spectrometer Interferogram Perturbation Compensation

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Solution Overview

Problem

Spectrometer systems with scanning Fourier Transform interferometers face issues with temporally periodic perturbations, which introduce false frequency components and artefacts in the intensity spectrum, making it difficult to distinguish real signals from noise without prior knowledge of the perturbations.

Innovation Solution

The system obtains interferograms at multiple scan speeds, allowing for the identification and correction of periodic perturbations by comparing intensity spectra generated from these interferograms, and using a weighted average to generate a corrected intensity spectrum that minimizes the impact of perturbations without degrading the signal-to-noise ratio.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If a scanning FT interferometer is used for optical spectroscopy, then spectral analysis capability is provided, but temporally periodic perturbations introduce false frequency components and artefacts in the intensity spectrum

Engineering Contradiction:
Improvespectral analysis accuracyVSAvoidtemporally periodic perturbations
Core Design Contradiction:
Measurement precisionVSObject-affected harmful factors

Solution Approach 1:

The patent applies periodic action by acquiring interferograms at multiple different scan speeds (different periodicities). This allows the system to sample the same spectral information at varying temporal frequencies, causing temporally periodic perturbations to manifest at different positions in the frequency domain for each scan speed. By comparing spectra from multiple scan speeds, the system can identify and eliminate artefacts caused by periodic perturbations while preserving genuine spectral features.

Inventive Principle:
Principle #19Periodic action

2Measurement precision

If multiple interferograms are acquired at different scan speeds to identify perturbations, then perturbation identification capability is improved, but measurement time increases

Engineering Contradiction:
Improveperturbation identification accuracyVSAvoidmeasurement time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The patent implements partial action by acquiring interferograms at a small number of different scan speeds (typically 2-3 different speeds) rather than continuously varying the scan speed. This limited set of measurements is sufficient to identify temporally periodic perturbations through comparison, achieving perturbation identification without requiring excessive measurement time. The method finds an optimal balance between perturbation detection capability and measurement efficiency.

Inventive Principle:
Principle #16Partial or excessive action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach effectively reduces the effect of periodic perturbations on the intensity spectrum, allowing for accurate signal recovery without degrading the signal-to-noise ratio in unaffected spectral regions.

Implementation Method 1

an observation beam consisting of relatively broad band radiation in a wavelength region of interest enters the interferometer, typically after it having interacted with a sample under observation, and strikes the beamsplitter. This observation beam is split into essentially two parts of equal intensity at the beamsplitter. A first beam is reflected by the beamsplitter and travels along a first 'arm' of the interferometer to the first reflector from where it is reflected back to the beamsplitter. A second beam is transmitted through the beamsplitter

Methodology Applied
Scientific EffectLight reflection and transmission: Reflection

Implementation Method 2

A first beam is reflected by the beamsplitter and travels along a first 'arm' of the interferometer to the first reflector from where it is reflected back to the beamsplitter. A second beam is transmitted through the beamsplitter and travels along a second 'arm' to the second reflector from where it is also reflected back to the beamsplitter

Methodology Applied
Scientific EffectLight reflection: Reflection

Implementation Method 3

The retardation, δ, is the difference between the optical path lengths of the two arms and depending on the retardation each wavelength of the spectral source may interfere destructively or constructively when the back-reflected light in the two arms overlap on the beamsplitter. The intensity pattern of the overlapping, interfering light as a function of retardation is hereinafter referred to as an observation interferogram.

Methodology Applied
Scientific EffectLight interference: Interference

Implementation Method 4

The observation interferogram is recorded by a detector as one or more of the reflectors (commonly a one of the reflectors) is/are moved at a constant speed to create cyclic excursions of the related optical path and hence a cyclic optical path length difference between the first and the second beams.

Methodology Applied
Scientific EffectPhotoelectric detection: Photoelectric Effect

Data Source

PatentEP3254073B1A spectrometer system and a method for compensating for time periodic perturbations of an interferogram generated by the spectrometer system
Publication Date: 2021.08.25 FOSS ANALYTICAL AS
  • EP3254073B1 patent drawingFigure 1
  • EP3254073B1 patent drawingFigure 2
  • EP3254073B1 patent drawingFigure 3

AI summary

A Spectrometer System and a Method for Compensating for Time Periodic Perturbations of an Interferogram generated by the Spectrometer System A spectrometer system (2) comprises a scanning interferometer (4); a drive system (6) mechanically coupled to a movable reflector element (14) of the scanning interferometer (4) and operable to effect reciprocation of the movable reflector element (14)at a plurality, preferably more than two, for example three, different scan speeds; a detector arrangement (8) configured to sample at equidistant time intervals an interferogram formed by the scanning interferometer (2) to generate a sampled interferogram; and a data processor (10) is adapted to acquire a sampled interferogram at each of the plurality of different scan speeds and to perform a relative comparison of the content of the so acquired plurality of sampled interferograms.