Spectrometer Calibration Using Secondary Reference Standards
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Solution Overview
Problem
Current spectrometer calibration techniques require a master instrument and numerous standardization samples, making it difficult to ensure consistent measurement responses across instruments and time-consuming, especially for multivariate calibrations, and are prone to variations due to small energy absorbance changes over wavelengths.
Innovation Solution
The method employs secondary reference samples (SRSs) for calibration maintenance and transfer, allowing for instrument and product model calibration corrections without a master instrument, enabling automation and reduced sample measurements, and ensuring traceability to national laboratories, with fewer product samples needed for verification.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If master instrument and numerous standardization samples are used for calibration, then measurement consistency across instruments can be ensured, but the calibration process becomes time-consuming and complex
Solution Approach 1:
The patent extracts the essential calibration function from the complex master instrument system and implements it through simple secondary reference samples that can be used independently without requiring a master instrument, thereby reducing calibration time while maintaining measurement consistency
Solution Approach 2:
The patent creates simplified copies of reference standards (secondary reference samples) that replicate the essential calibration characteristics without requiring the full complexity of master instrument systems, enabling faster calibration while preserving measurement reliability
2Measurement precision
If multivariate calibration is performed with extensive standardization samples, then calibration accuracy can be improved, but the complexity and time required for calibration increases significantly
Solution Approach 1:
The patent extracts the critical calibration information from complex multivariate standardization samples and encapsulates it in simpler secondary reference samples, maintaining calibration accuracy while reducing the complexity of the calibration setup
Solution Approach 2:
The patent changes the calibration approach from using numerous standardization samples with complex multivariate parameters to using secondary reference samples with simplified parameters that retain the essential calibration information needed for accurate measurements
3Reliability
If traditional calibration methods with multiple standardization samples are used, then comprehensive calibration coverage is achieved, but the number of samples and verification requirements increase
Solution Approach 1:
The patent creates secondary reference samples that serve multiple calibration functions simultaneously, replacing the need for numerous specialized standardization samples, thereby maintaining comprehensive calibration coverage while reducing the total quantity of samples required
Solution Approach 2:
The patent extracts the essential calibration coverage from extensive standardization sample sets and concentrates it into fewer secondary reference samples, achieving the same comprehensive coverage with reduced sample quantities
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach allows for accurate and efficient calibration of spectrometers, ensuring alignment with factory transfer specifications, achieving high accuracy and reducing the need for extensive calibration setups and standardization samples, thereby improving calibration consistency and efficiency.
Implementation Method 1
a spectrophotometer operates by directing radiation at a wavelength (or range of wavelengths) toward a sample under test, detecting an amount of radiation absorbed by the sample at the specific wavelength
Data Source
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AI summary
Aspects of spectrometer secondary reference calibration are described. In one embodiment, a diagnostic measurement for evaluation of an aspect of calibration in spectroscopy is performed. A result of the diagnostic measurement is analyzed to determine a deviation from an expected result. Based on the analysis, a correction algorithm may be applied to the aspect of calibration, in view of the deviation. In some embodiments, a product model diagnostic measurement is also performed for further evaluation of the aspect of calibration. A result of the product model diagnostic measurement is analyzed to determine a product model deviation from an expected result of the product model diagnostic measurement, and a product model correction algorithm is applied, if necessary. According to aspects of the embodiments described herein, using secondary reference standards permits reconstruction of calibration parameters without any need for a master instrument or other forms of calibrated reference instrumentation.